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公开(公告)号:US11914180B2
公开(公告)日:2024-02-27
申请号:US17911875
申请日:2021-03-15
Applicant: NITTO DENKO CORPORATION
Inventor: Yudai Numata , Masato Katsuda , Shoichi Matsuda
CPC classification number: G02B5/26 , G02B5/0242 , G02B5/0284 , G02B5/208
Abstract: An optical filter has a back-scattering property. The linear transmittance thereof to light of at least some avelengths in the wavelength range of 760-2000 nm is 60% or higher. The azimuth is 20° from an incidence plane when the polar angle of the direction of incidence of incident light is 0°. The value of a bidirectional reflectance distribution function in the direction ‘here the polar angle is −60’ is BRDF (0°; 20°, −60°). The azimuth is 20° from an incidence plane when the polar angle of the direction of incidence of incident light is 30°. The value of a bidirectional reflectance distribution function in the direction where the polar angle is −60° is BRDF (30°; 20°, −60°). The azimuth is 20° from an incidence plane when the polar angle of the direction of incidence of incident light is 60°.
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公开(公告)号:US11914176B2
公开(公告)日:2024-02-27
申请号:US17911889
申请日:2021-03-15
Applicant: NITTO DENKO CORPORATION
Inventor: Yudai Numata , Masato Katsuda , Shoichi Matsuda
IPC: G02B5/20
Abstract: This optical filter 10 has an L* of at least 20 as measured by the SCE method, wherein the linear transmittance is at least 60% with respect to light the wavelength of which falls at least partially within the wavelength range of 760 nm-2,000 nm, and the temperature, at which the optical filter contracts by being heated, is at least 85° C.
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公开(公告)号:US11914177B2
公开(公告)日:2024-02-27
申请号:US17911915
申请日:2021-03-15
Applicant: NITTO DENKO CORPORATION
Inventor: Masato Katsuda , Yudai Numata , Shoichi Matsuda
IPC: G02B5/20
Abstract: Disclosed is an optical filter with L* measured by the SCE method being 20 or greater, wherein: the linear transmittance with respect to light with wavelengths being at least a portion of a wavelength range from 760 nm to 2000 nm is 60% or greater; and, before and after a light resistance test wherein light of a xenon arc lamp (average integrated illuminance of light with wavelengths from 300 nm to 400 nm:120 W/m2) is shone for 300 hours, the absolute value of a change in C* measured by the SCE method using a spectroscopic colorimeter is 6 or less.
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