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公开(公告)号：US20220258279A1
公开(公告)日：2022-08-18
申请号：US17628551
申请日：2020-07-20
申请人： NOVANTA EUROPE GMBH
IPC分类号： B23K26/0622 , B23K26/082
摘要： The invention relates to a method for processing material, in particular for modifying material and/or material properties, by means of laser radiation, comprising the following steps: a) generating a multiplicity of laser pulses (L); b) controlling the point of impact of the laser pulses (L) on a workpiece (100) to be processed, in particular deflecting the laser pulses (L) and/or moving the workpiece (100) to be processed, such that the laser pulses (L) are guided along a predetermined trajectory (Z) on the workpiece (100) to be processed. According to the invention, —a pulse-to-pulse time interval (Δt) between the individual laser pulses (L) generated and/or—a pulse energy (Pi) of the laser pulses (L) and/or—a beam diameter (D) of the laser pulses (D) and/or—the predetermined trajectory (Z) is/are specifically subjected to noise.
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公开(公告)号：US20240231081A9
公开(公告)日：2024-07-11
申请号：US18276945
申请日：2022-02-08
申请人： NOVANTA EUROPE GMBH
CPC分类号： G02B27/0031 , G02B5/021 , G02B26/101
摘要： The invention relates to a method for scanning field correction at least of a laser scanner device (300), wherein the method comprises the following steps: —providing a scatter pattern element (30) on a processing plane (11), wherein the scatter pattern element (30) comprises at least one scatter region (31) which is arranged in a scatter pattern (M); —passing over or scanning at least one part of the scatter pattern element (30) on the processing plane (11) by means of a laser beam (12) of the at least one laser scanner device (300) along scanner coordinates (x, y, z), wherein the laser beam passes through at least one window (20), preferably protective glass, between a deflection unit (10) and the processing plane (11); —detecting scatter radiation (13) which can be generated by scattering and/or reflection of the laser beam (12) when passing over or scanning the at least one scatter region (31); —creating a contour diagram (K) by correlating the detected scatter radiation (13) with the scanner coordinates (x, y, z); —comparing the contour diagram (K) with a reference image of the scatter pattern (M) and determining a deviation of the contour diagram (K) from the reference image of the scatter pattern (M); —calculating a calibration function for calibrated control of the deflection unit (10) on the basis of the determined deviation.
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公开(公告)号：US20240134188A1
公开(公告)日：2024-04-25
申请号：US18276945
申请日：2022-02-08
申请人： NOVANTA EUROPE GMBH
CPC分类号： G02B27/0031 , G02B5/021 , G02B26/101
摘要： The invention relates to a method for scanning field correction at least of a laser scanner device (300), wherein the method comprises the following steps: —providing a scatter pattern element (30) on a processing plane (11), wherein the scatter pattern element (30) comprises at least one scatter region (31) which is arranged in a scatter pattern (M); —passing over or scanning at least one part of the scatter pattern element (30) on the processing plane (11) by means of a laser beam (12) of the at least one laser scanner device (300) along scanner coordinates (x, y, z), wherein the laser beam passes through at least one window (20), preferably protective glass, between a deflection unit (10) and the processing plane (11); —detecting scatter radiation (13) which can be generated by scattering and/or reflection of the laser beam (12) when passing over or scanning the at least one scatter region (31); —creating a contour diagram (K) by correlating the detected scatter radiation (13) with the scanner coordinates (x, y, z); —comparing the contour diagram (K) with a reference image of the scatter pattern (M) and determining a deviation of the contour diagram (K) from the reference image of the scatter pattern (M); —calculating a calibration function for calibrated control of the deflection unit (10) on the basis of the determined deviation.
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