Buried Zener Design
    1.
    发明申请

    公开(公告)号:US20220285564A1

    公开(公告)日:2022-09-08

    申请号:US17192060

    申请日:2021-03-04

    Applicant: NXP B.V.

    Abstract: A method for manufacturing a Zener diode includes implanting an N-type Buried Layer (NBL) with an N-type dopant in a first epitaxial layer, wherein the NBL comprises an NBL opening excluding the N-type dopant. A P-type Buried Layer (PBL) having a peak PBL doping concentration below the NBL is implanted. A second epitaxial layer is grown over the NBL. A P-type region (Plink) is implanted to couple to the PBL above the NBL opening, and to couple the Plink to an Anode electrode. An N-type region (Nlink) is implanted to couple the NBL to a Cathode electrode.

    Buried Zener design
    2.
    发明授权

    公开(公告)号:US11640997B2

    公开(公告)日:2023-05-02

    申请号:US17192060

    申请日:2021-03-04

    Applicant: NXP B.V.

    Abstract: A method for manufacturing a Zener diode includes implanting an N-type Buried Layer (NBL) with an N-type dopant in a first epitaxial layer, wherein the NBL comprises an NBL opening excluding the N-type dopant. A P-type Buried Layer (PBL) having a peak PBL doping concentration below the NBL is implanted. A second epitaxial layer is grown over the NBL. A P-type region (Plink) is implanted to couple to the PBL above the NBL opening, and to couple the Plink to an Anode electrode. An N-type region (Nlink) is implanted to couple the NBL to a Cathode electrode.

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