公开(公告)号：US11489535B1

公开(公告)日：2022-11-01

申请号：US17302729

申请日：2021-05-11

Applicant: NXP B.V.

Inventor： Xiankun Jin ,  Douglas Alan Garrity ,  Mark Lehmann ,  Kumar Abhishek

IPC: H03M1/10

Abstract: Body text indent—does not have paragraph numbering turned on. Not needed in the Abstract. An integrated circuit device includes a digital sine wave generator configured to produce portions of a digital sine wave, a combiner circuit configured to output each of the portions of the digital sine wave combined with a respective calibration code during operation in a post-production dynamic test mode, a digital to analog converter (DAC) configured to output an analog sine wave based on the output of the combiner circuit, and a test analog to digital converter (ADC) including an input terminal directly connected to the output of the DAC, and configured to generate a second digital sine wave based on the analog sine wave.

公开(公告)号：US20220368338A1

公开(公告)日：2022-11-17

申请号：US17302729

申请日：2021-05-11

Applicant: NXP B.V.

Inventor： Xiankun Jin ,  Douglas Alan Garrity ,  Mark Lehmann ,  Kumar Abhishek

IPC: H03M1/10

Abstract: An integrated circuit device includes a digital sine wave generator configured to produce portions of a digital sine wave, a combiner circuit configured to output each of the portions of the digital sine wave combined with a respective calibration code during operation in a post-production dynamic test mode, a digital to analog converter (DAC) configured to output an analog sine wave based on the output of the combiner circuit, and a test analog to digital converter (ADC) including an input terminal directly connected to the output of the DAC, and configured to generate a second digital sine wave based on the analog sine wave.