公开(公告)号：US11635607B2

公开(公告)日：2023-04-25

申请号：US17323302

申请日：2021-05-18

Applicant: Northwestern University

Inventor： Ki-Hee Song ,  Cheng Sun ,  Hao F. Zhang

IPC: G02B21/16 ,  G01N21/64 ,  G02B21/36 ,  G02B5/04 ,  G02B27/14

Abstract: A method of microscopy comprises collecting an emission light; symmetrically dispersing the collected emission light into a first order (“1st”) light and a negative first order (“−1st”) light using a grating; wherein the 1st light comprises spectral information and the −1st light comprises spectral information; capturing the 1st light and the −1st light using a camera, localizing the one or more light-emitting materials using localization information determined from both the first spectral image and the second spectral image; and determining spectral information from the one or more light-emitting materials using the first spectral image and/or the second spectral image; wherein the steps of localizing and obtaining are performed simultaneously. A spectrometer for a microscope comprises a dual-wedge prism (“DWP”) for receiving and spectrally dispersing a light beam, wherein the DWP comprises a first dispersive optical device and a second dispersive optical device adhered to each other.