公开(公告)号：US20240012036A1

公开(公告)日：2024-01-11

申请号：US18371628

申请日：2023-09-22

Applicant: Panduit Corp.

Inventor： Rachel M. Bugaris ,  Craig T. Hoeppner ,  John C. Senese

IPC: G01R19/155 ,  G01R31/327

CPC classification number: G01R19/155 ,  G01R31/3275 ,  G06F1/30

Abstract: An installed device electrically connected to a power source. The installed device has circuitry capable of detecting voltage, performing self-diagnostics, and testing for connectivity to the power source. In one embodiment, the device can also check to see if the voltage is at a de-energized level, recheck for continuity and repeat the self-diagnostics. In another embodiment, the installed device can be electrically connected to the line and load side of a disconnect and have circuitry configured to check the status of the disconnect. In another embodiment, the device can be configured to communicate with a portable reader in order to transfer information to the portable reader. In yet another embodiment, the device can be configured to interact with a controller that controls access to the panel in which the device is installed.

公开(公告)号：US09921260B2

公开(公告)日：2018-03-20

申请号：US15104074

申请日：2014-12-16

Applicant: Panduit Corp.

Inventor： Rachel M. Bugaris ,  John C. Senese ,  Craig T. Hoeppner ,  James E. Fabiszak ,  Richard A. Rago ,  Masud Bolouri-Saransar ,  Ronald A. Nordin ,  Nekheel S. Gajjar

IPC: G01R31/02 ,  G01R19/155 ,  H04B3/46

CPC classification number: G01R31/026 ,  G01R19/155 ,  G01R31/02 ,  G01R31/021 ,  G01R31/024 ,  H04B3/46

Abstract: A system for testing electrical continuity of a device to a source wherein there is at least one conductor connecting the device to the source can include a reference capacitive load, an oscillator, and a microprocessor. The oscillator is selectively connected to the reference capacitive load and each conductor connecting the device to the source such that the frequency output of the oscillator is a function of the selected capacitive load of the oscillator. Each conductor connecting the device to the source is connected to the oscillator such that when each one is selectively connected, the output of the oscillator is a function of that conductor's parasitic self-capacitance. The microprocessor can then compare the frequency of the signal generated when each conductor is connected to the oscillator with the frequency of the signal generated when the reference capacitive load is connected.

公开(公告)号：US20160313386A1

公开(公告)日：2016-10-27

申请号：US15104074

申请日：2014-12-16

Applicant: PANDUIT CORP.

Inventor： Rachel M. Bugaris ,  John C. Senese ,  Craig T. Hoeppner ,  James E. Fabiszak ,  Richard A. Rago ,  Masud Bolouri-Saransar ,  Ronald A. Nordin ,  Nakheel S. Gajjar

IPC: G01R31/02 ,  G01R19/155

CPC classification number: G01R31/026 ,  G01R19/155 ,  G01R31/02 ,  G01R31/021 ,  G01R31/024 ,  H04B3/46

Abstract: A system for testing electrical continuity of a device to a source wherein there is at least one conductor connecting the device to the source can include a reference capacitive load, an oscillator, and a microprocessor. The oscillator is selectively connected to the reference capacitive load and each conductor connecting the device to the source such that the frequency output of the oscillator is a function of the selected capacitive load of the oscillator. Each conductor connecting the device to the source is connected to the oscillator such that when each one is selectively connected, the output of the oscillator is a function of that conductor's parasitic self-capacitance. The microprocessor can then compare the frequency of the signal generated when each conductor is connected to the oscillator with the frequency of the signal generated when the reference capacitive load is connected.

Abstract translation: 用于测试设备到源的电连续性的系统，其中存在将设备连接到源的至少一个导体可以包括参考容性负载，振荡器和微处理器。 振荡器选择性地连接到参考电容性负载，并且每个导体将器件连接到源极，使得振荡器的频率输出是所选择的振荡器的容性负载的函数。 将器件连接到源极的每个导体连接到振荡器，使得当每个导体选择性地连接时，振荡器的输出是该导体的寄生自电容的函数。 然后，微处理器可以将每个导体连接到振荡器时产生的信号的频率与连接参考电容性负载时产生的信号的频率进行比较。