-
Patent Agency Ranking
公开(公告)号：US11537903B2
公开(公告)日：2022-12-27
申请号：US16573953
申请日：2019-09-17
Applicant: Palantir Technologies Inc.
Inventor： William Seaton , Clemens Wiltsche , Myles Novick , Rootul Patel
Abstract: Systems and methods are provided for reducing failure rates of a manufactured products. Manufactured products may be clustered together according to similarities in their production data. Manufactured product clusters may be analyzed to determine mechanisms for failure rate reduction, including adjustments to test quality parameters, product formulas, and product processes. Recommended product adjustments may be provided.
-
公开(公告)号：US10482382B2
公开(公告)日：2019-11-19
申请号：US15590959
申请日：2017-05-09
Applicant: Palantir Technologies Inc.
Inventor： William Seaton , Clemens Wiltsche , Myles Novick , Rootul Patel
Abstract: Systems and methods are provided for reducing failure rates of a manufactured products. Manufactured products may be clustered together according to similarities in their production data. Manufactured product clusters may be analyzed to determine mechanisms for failure rate reduction, including adjustments to test quality parameters, product formulas, and product processes. Recommended product adjustments may be provided.
-
公开(公告)号：US11954607B2
公开(公告)日：2024-04-09
申请号：US17992769
申请日：2022-11-22
Applicant: Palantir Technologies Inc.
Inventor： William Seaton , Clemens Wiltsche , Myles Novick , Rootul Patel
Abstract: Systems and methods are provided for reducing failure rates of a manufactured products. Manufactured products may be clustered together according to similarities in their production data. Manufactured product clusters may be analyzed to determine mechanisms for failure rate reduction, including adjustments to test quality parameters, product formulas, and product processes. Recommended product adjustments may be provided.
-
公开(公告)号：US20200012950A1
公开(公告)日：2020-01-09
申请号：US16573953
申请日：2019-09-17
Applicant: Palantir Technologies Inc.
Inventor： William Seaton , Clemens Wiltsche , Myles Novick , Rootul Patel
IPC: G06N5/02
Abstract: Systems and methods are provided for reducing failure rates of a manufactured products. Manufactured products may be clustered together according to similarities in their production data. Manufactured product clusters may be analyzed to determine mechanisms for failure rate reduction, including adjustments to test quality parameters, product formulas, and product processes. Recommended product adjustments may be provided.
-
公开(公告)号：US20180330241A1
公开(公告)日：2018-11-15
申请号：US15590959
申请日：2017-05-09
Applicant: Palantir Technologies Inc.
Inventor： William Seaton , Clemens Wiltsche , Myles Novick , Rootul Patel
IPC: G06N5/02
Abstract: Systems and methods are provided for reducing failure rates of a manufactured products. Manufactured products may be clustered together according to similarities in their production data. Manufactured product clusters may be analyzed to determine mechanisms for failure rate reduction, including adjustments to test quality parameters, product formulas, and product processes. Recommended product adjustments may be provided.
-
-
-
-
Search Results
5
records
(took 0.017 seconds)
