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公开(公告)号:US12049710B2
公开(公告)日:2024-07-30
申请号:US18209840
申请日:2023-06-14
发明人: Yusuke Mori , Masashi Yoshimura , Masayuki Imanishi , Akira Kitamoto , Junichi Takino , Tomoaki Sumi , Yoshio Okayama
CPC分类号: C30B29/406 , C30B33/08 , C30B25/02
摘要: A group-III nitride substrate includes: a first region having a first impurity concentration in a polished surface; and a second region having a second impurity concentration lower than the first impurity concentration in the polished surface, wherein a first dislocation density of the first region is lower than a second dislocation density of the second region.
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公开(公告)号:US11753739B2
公开(公告)日:2023-09-12
申请号:US17479516
申请日:2021-09-20
发明人: Yusuke Mori , Masashi Yoshimura , Masayuki Imanishi , Akira Kitamoto , Junichi Takino , Tomoaki Sumi
CPC分类号: C30B25/165 , C30B29/403
摘要: A method of manufacturing a group-III nitride crystal includes: preparing a seed substrate; and supplying a group-III element oxide gas and a nitrogen element-containing gas at a supersaturation ratio (Po/Pe) greater than 1 and equal to or less than 5, then, growing a group-III nitride crystal on the seed substrate, wherein the Po is a supply partial pressure of the group-III element oxide gas, and the Pe is an equilibrium partial pressure of the group-III element oxide gas.
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