公开(公告)号：US20250013211A1

公开(公告)日：2025-01-09

申请号：US18709355

申请日：2022-06-29

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Naganori SHIRAKATA ,  Shun TAKAYANAGI ,  Taichi SATO ,  Takayuki TSUKIZAWA ,  Takeshi ARAI

IPC: G05B13/04

Abstract: The present disclosure relates to a technology for automatically and efficiently searching for a facility control parameter. One aspect of the present disclosure relates to an automatic parameter adjustment device comprising: a plurality of facility models that model a facility; a control parameter setter that sets a plurality of first control parameters for use in a first trial to the plurality of facility models, and set a second control parameter for use in the first trial to the facility; and a comparer that compares a model operation result of the first trial of the plurality of facility models under the plurality of first control parameters with an actual machine operation result of the first trial of the facility under the second control parameter, wherein the control parameter setter selects a control parameter for use in a second trial based on a first comparison result between the model operation result of the first trial and the actual machine operation result of the first trial.