公开(公告)号：US20170023481A1

公开(公告)日：2017-01-26

申请号：US15194059

申请日：2016-06-27

Applicant: Panasonic Intellecutal Property Management Co., Ltd.

Inventor： YOSHIHISA NAGASAKI ,  NOBUYASU SUZUKI ,  YUKIHIKO SUGIO

IPC: G01N21/65

CPC classification number: G01N21/65 ,  G01M3/38 ,  G01N33/005 ,  G01N2201/0612

Abstract: A hydrogen gas inspection method includes: converting first light having a first wavelength to second light having a second wavelength longer than the first wavelength by using a phosphor, the first light being emitted from a semiconductor light emitting device; irradiating a space to be inspected with the second light; and determining whether hydrogen gas is present in the space utilizing Raman scattered light generated by the hydrogen gas irradiated with the second light.

Abstract translation: 氢气检查方法包括：通过使用荧光体将具有第一波长的第一光转换成具有比第一波长长的第二波长的第二光，第一光从半导体发光器件发射; 用第二光照射要检查的空间; 以及利用由所述第二光照射的氢气产生的拉曼散射光来确定在所述空间中是否存在氢气。