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公开(公告)号:US10151709B2
公开(公告)日:2018-12-11
申请号:US14732831
申请日:2015-06-08
申请人: PaneraTech, Inc.
发明人: Yakup Bayram , Alexander Ruege , Eric Walton , Peter Hagan
摘要: Disclosed is an improved device and method to evaluate the status of a material by scanning an area that overlaps a region of the material under evaluation. The device and method are operative to identify a leakage of a first material into a second material, such as a molten material surrounded by a refractory material, to measure the thickness of the second material, using electromagnetic waves, and to generate images. The device is designed to reduce a plurality of reflections associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities present in between the device and the enclosed material. Furthermore, the device can be configured to scan areas of interest in either a portable or fixed configuration, manually in a standalone mode or as part of an automated system.
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公开(公告)号:US20150362439A1
公开(公告)日:2015-12-17
申请号:US14732831
申请日:2015-06-08
申请人: PaneraTech, Inc.
发明人: Yakup Bayram , Alexander Ruege , Eric Walton , Peter Hagan
摘要: Disclosed is an improved device and method to evaluate the status of a material by scanning an area that overlaps a region of the material under evaluation. The device and method are operative to identify a leakage of a first material into a second material, such as a molten material surrounded by a refractory material, to measure the thickness of the second material, using electromagnetic waves, and to generate images. The device is designed to reduce a plurality of reflections associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities present in between the device and the enclosed material. Furthermore, the device can be configured to scan areas of interest in either a portable or fixed configuration, manually in a standalone mode or as part of an automated system.
摘要翻译: 公开了一种通过扫描与被评估材料的区域重叠的区域来评估材料状态的改进的装置和方法。 该装置和方法用于识别第一材料泄漏到第二材料(例如由耐火材料包围的熔融材料)中,以使用电磁波测量第二材料的厚度并产生图像。 该装置被设计成减少与发射到被评估材料中的电磁波的传播相关联的多个反射足够的程度,以便能够检测出存在于装置和封闭件之间的远程不连续性的感兴趣的电磁波 材料。 此外,该设备可以被配置为以便携式或固定配置扫描感兴趣的区域,手动地以独立模式或作为自动化系统的一部分。
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