摘要:
An object is scanned first with a light plane from a variable-intensity light-plane projector, and the reflected light is used as signals to modify point by point the output of the projector in accordance with the intensity of the respective reflective-light signal. Thereupon the object is scanned a second time and the projector is instructed to apply less light than before to those points of the object from which a strong reflected-light signal was received during the first scan, and/or to apply more light to points from which a weak reflected-light signal was received during the first scan. In similar manner, a projected intensity encoded light volume is projected on an object and the reflected light is used as signals to point-by-point modify the output of the projector for subsequent projections.
摘要:
A method for locating points on a surface, in which the surface is irradiated selectively with an irradiating volume which has a varying intensity that defines a first pattern. After irradiating the surface with the first pattern, the surface is irradiated similarly with volume(s) having varying intensity(ies) defining a second (or more) pattern(s). Both (or all) of these patterns are applied to a point to be located on the surface. The radiation impinging on the surface is recorded by a camera which forms images of these patterns. The images are scanned to find the intensities of the point in the two (or more) patterns. The location of the point on the surface is dependent on a predetermined ratio or difference of the intensities of the point in the two (or more) patterns. The patterns may be linear, sinusoidal, smooth, non-smooth and/or two dimensional functions ultimately producing a single valued ratio or difference result.
摘要:
An object is scanned first with a flying light spot from a variable-intensity light-spot projector, and the reflected light is used as signals to point by point modify the output of the projector in accordance with the intensity of the respective reflective-light signal. Thereupon the object is scanned a second time and the projector instructed to apply less light than before to those points of the object from which a strong reflected-light signal was received during the first scan, and to apply more light to points from which a weak reflected-light signal was received during the first scan.
摘要:
An apparatus with a common aperture and multiple image recording surfaces with individual filters and/or controlled shutters enables the implementation of several methods of 3-D measurement systems. The parallel nature of the device lends to short measurement times suitable for measuring moving objects. A similar apparatus may be constructed to project multiple images simultaneously or in rapid succession. Elimination of mechanical motion within the projectors and cameras of the prior art reduce the measurement time significantly. A new method of 3-D measurement employing a sweeping light plane and time encoded image recording uses the apparatus. An alternate method maintains a stationary projected light plane through which an object moves as it is measured in 3-D. Another method uses simultaneous projection of light patterns at different frequencies. Another method employs the time of flight of a light pulse and time encoded recording of the reflected energy.
摘要:
A method for locating points on a surface in which the surface is irradiated selectively with an irradiating volume which has a varying intensity that defines a first pattern. After irradiating the surface with the first pattern, the surface is irradiated similarly with volumes having varying intensities defining a second or more patterns. Both of these patterns are applied to a point to be located on the surface. The radiation impinging on the surface is recorded by a camera which forms images of the patterns. The images are scanned to find the intensities of the point in the two or more patterns. More than one pattern may be simultaneously irradiated, using different frequencies to distinquish the data. The location of the point on the surface is dependent on a predetermined ratio or difference of the intensities of the point in the two or more patterns. The patterns may be linear, sinusoidal, smooth, non-smooth and/or two dimensional functions ultimately producing a single valued ratio or difference result.
摘要:
An arrangement in which three-dimensional measurement sensors are calibrated using linear translation of three flat plates, one orthogonal to the path, one sloping vertically, one sloping horizontally. Sensors for which linear interpolation applies need only calibrate two surfaces of the sensor volume for complete calibration. Two flat surfaces are adequate for calibrating a volume if one surface is used twice.
摘要:
Methods are provided for reducing the number of projected patterns required to make two- or three-dimensional surface measurements on a sub-class of surfaces comprising relatively smooth surfaces. By including apriori knowledge about the surface to be measured, pattern ambiguities can be resolved by processing rather than by additional projected patterns.
摘要:
Methods are provided for reducing the number of projected patterns required to make two- or three-dimensional surface measurements on a sub-class of surfaces comprising relatively smooth surfaces. By including apriori knowledge about the surface to be measured, pattern ambiguities can be resolved by processing rather than by additional projected patterns.
摘要:
Methods are provided for reducing the number of projected patterns required to make two- or three-dimensional surface measurements on a sub-class of surfaces comprising relatively smooth surfaces. By including apriori knowledge about the surface to be measured, pattern ambiguities can be resolved by processing rather than by additional projected patterns.
摘要:
The physical location of a surface in six degrees of freedom relative to the nominal location of a nominal surface is uniquely defined automatically by a measurement system provided with a processing unit, if sufficient asymmetric curvature exists in the surface to uniquely locate three points on the surface. Useful in inspection and material handling applications, a master model of the surface with a known location is defined. Two points are selected on the surface and then a plane is passed through the points, preferably perpendicular to the surface if no edge is present. Then a third point is selected along the curve of intersection so that the three points form a unique triangular template that locates the points along the curve. If the three points are on a sharp edge of the surface this may be adequate information. Otherwise a plane is passed through one of the points (or two planes, one through each of the two points), preferably perpendicular to the first plane, and two additional points are selected along the curve of intersection so that the three points form a unique triangular template that locates the points in the direction orthogonal to the direction of the first curve. Thus, depending on the surface curvature, as few as three points are chosen and measurements made in those relative locations on the surface to be located. By fitting the measured data to the nominal model surface, the location of the surface relative to the model can be determined.