摘要:
Methods, systems, and apparatuses are provided for estimating a location on an object in a three-dimensional scene. Multiple radiation patterns are produced by spatially modulating each of multiple first radiations with a distinct combination of one or more modulating structures, each first radiation having at least one of a distinct radiation path, a distinct source, a distinct source spectrum, or a distinct source polarization with respect to the other first radiations. The location on the object is illuminated with a portion of each of two or more of the radiation patterns, the location producing multiple object radiations, each object radiation produced in response to one of the multiple radiation patterns. Multiple measured values are produced by detecting the object radiations from the location on the object due to each pattern separately using one or more detector elements. The location on the object is estimated based on the multiple measured values.
摘要:
Methods, systems, and apparatuses are provided for estimating a location on an object in a three-dimensional scene. Multiple radiation patterns are produced by spatially modulating each of multiple first radiations with a distinct combination of one or more modulating structures, each first radiation having at least one of a distinct radiation path, a distinct source, a distinct source spectrum, or a distinct source polarization with respect to the other first radiations. The location on the object is illuminated with a portion of each of two or more of the radiation patterns, the location producing multiple object radiations, each object radiation produced in response to one of the multiple radiation patterns. Multiple measured values are produced by detecting the object radiations from the location on the object due to each pattern separately using one or more detector elements. The location on the object is estimated based on the multiple measured values.
摘要:
Methods, systems, and apparatuses are provided for estimating a location on an object in a three-dimensional scene. Multiple radiation patterns are produced by spatially modulating each of multiple first radiations with a distinct combination of one or more modulating structures, each first radiation having at least one of a distinct radiation path, a distinct source, a distinct source spectrum, or a distinct source polarization with respect to the other first radiations. The location on the object is illuminated with a portion of each of two or more of the radiation patterns, the location producing multiple object radiations, each object radiation produced in response to one of the multiple radiation patterns. Multiple measured values are produced by detecting the object radiations from the location on the object due to each pattern separately using one or more detector elements. The location on the object is estimated based on the multiple measured values.
摘要:
An image photographing apparatus and a method for controlling the image photographing apparatus are provided. The method includes outputting light so as to penetrate a projection and fall on an object, receiving first reflective light reflected from an object, obtaining a first image based on information of the first reflective light, controlling the projection using predetermined information to generate a controlled projection, receiving second reflective light using the controlled projection, obtaining a second image based on information of the second reflective light, and generating a depth map using the obtained first image and second image.
摘要:
A method obtains the shape of a target by projecting and recording images of dual frequency fringe patterns. Locations in each projector image plane are encoded into the patterns and projected onto die target while images are recorded. The resulting images show the patterns superimposed onto the target. The images are decoded to recover relative phase values for the patterns primary and dual frequencies. The relative phases are unwrapped into absolute phases and converted back to projector image plane locations. The relation between camera pixels and decoded projector locations is saved as a correspondence image representing the measured shape of the target. Correspondence images with a geometric triangulation method create a 3D model of the target. Dual frequency hinge patterns have a low frequency embedded into a high frequency sinusoidal, both frequencies are recovered in closed form by the decoding method, thus, enabling direct phase unwrapping.
摘要:
Systems, methods, and media for performing shape measurement are provided. In some embodiments, systems for performing shape measurement are provided, the systems comprising: a projector that projects onto a scene a plurality of illumination patterns, wherein each of the illumination patterns has a given frequency, each of the illumination patterns is projected onto the scene during a separate period of time, three different illumination patterns are projected with a first given frequency, and only one or two different illumination patterns are projected with a second given frequency; a camera that detects an image of the scene during each of the plurality of periods of time; and a hardware processor that is configured to: determine the given frequencies of the plurality of illumination patterns; and measure a shape of an object in the scene.
摘要:
A three-dimensional measurement apparatus for calculating three-dimensional shape information of a target object, comprising: capturing means for capturing reflected pattern light of stripe pattern light formed by alternately arranging a bright portion and a dark portion as first image data, and capturing reflected pattern light of reversed stripe pattern light formed by reversing the bright portion and the dark portion of the stripe pattern light as second image data; determination means for determining a boundary position between the bright portion and the dark portion based on the first image data and the second image data; and reliability calculation means for calculating a reliability indicating accuracy of the boundary position from a correlation between a first luminance gradient of the first image data and a second luminance gradient of the second image data.
摘要:
On the basis of captured images at the time of projecting multiple-frequency slit-shaped light patterns having no overlapping edge positions onto an object, the edge portions of the slit-shaped light patterns are identified. When the edge portions overlap in the captured images of two or more slit-shaped light patterns, the reliability of the computed distance values of the positions corresponding to the edges is lowered.
摘要:
A method for determining three-dimensional coordinates of an object point on a surface of an object, including steps of providing a transparent plate having a first region and a second region, the second region having a different wedge angle than the first region; splitting a first beam of light into a first light and a second light; sending the first light through the first region or the second region; combining the first light and the second light to produce a fringe pattern on the surface of the object, the pitch of the fringe pattern depending on the wedge angle through which the first light travels; imaging the object point onto an array point on a photosensitive array to obtain an electrical data value; determining the three-dimensional coordinates of the first object point based at least in part on the electrical data value.
摘要:
A computer-implemented process, system, and computer-readable storage medium having stored thereon, program code and instructions for 3-D triangulation-based image acquisition of a contoured surface/object-of-interest under observation by at least one camera, by projecting onto the surface-of-interest a multi-frequency pattern comprising a plurality of pixels representing at least a first and second superimposed sinusoid projected simultaneously, each of the sinusoids represented by the pixels having a unique temporal frequency and each of the pixels projected to satisfy I n p = A p + ∑ k = 1 K B k p cos ( 2 π f k y p + 2 π kn N ) Eq . ( 1.1 ) where Inp is the intensity of a pixel in the projector for nth projected image in a particular instant in time; K is an integer representing the number of component sinusoids (e.g., K=2 for a dual-frequency sinusoid pattern, K=3 for a triple-frequency sinusoid, and so on), each component sinusoid having a distinct temporal frequency, where K is less than or equal to (N+1)/2. Images then captured by the camera are defined according to: I n c = A c + ∑ k = 1 K B k c cos ( 2 π f k y p + 2 π kn N ) + η Eq . ( 1.2 ) To obtain phase terms from the pixels projected in accordance with Eq. 1.2, for each k: 2 π f k y p = arctan ( ∑ n = 0 N - 1 I n c × cos ( 2 π kn N ) ∑ n = 0 N - 1 I n c × sin ( 2 π kn N ) ) . Eq . ( 1.3 )