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公开(公告)号：US08234913B2
公开(公告)日：2012-08-07
申请号：US11922699
申请日：2006-06-21
申请人： Paul Girard , Michel Ramonda , Richard Arinero
发明人： Paul Girard , Michel Ramonda , Richard Arinero
IPC分类号： G01B5/28
摘要： The invention concerns a microscopic system with atomic force, comprising a probe tip placed on one end of a lever arm (2), oscillating means (1) adapted to oscillate said probe tip substantially based on the fundamental frequency of said lever arm, said system including control means (7) for controlling said oscillating means to vary the oscillation frequency of said tip based on a plurality of harmonics of said lever arm. The invention is characterized in that said control means comprise an input receiving a parameter representing an operating threshold of said system, to vary the oscillation frequency of said tip based on at least one harmonic of said lever arm when said signal corresponds to a state of said system higher than said operating threshold.
摘要翻译： 本发明涉及具有原子力的微观系统，包括放置在杠杆臂（2）的一端的探针尖端，适于基本上基于所述杠杆臂的基本频率摆动所述探针尖端的振荡装置（1），所述系统 包括用于控制所述振荡装置的控制装置（7），以便基于所述杠杆臂的多个谐波来改变所述尖端的振荡频率。 本发明的特征在于，所述控制装置包括接收表示所述系统的操作阈值的参数的输入，当所述信号对应于所述控制臂的状态时，基于所述杠杆臂的至少一个谐波来改变所述尖端的振荡频率 系统高于所述操作阈值。
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公开(公告)号：US20080223120A1
公开(公告)日：2008-09-18
申请号：US11922699
申请日：2006-06-21
申请人： Paul Girard , Michel Ramonda , Richard Arinero
发明人： Paul Girard , Michel Ramonda , Richard Arinero
摘要： The invention concerns a microscopic system with atomic force, comprising a probe tip placed on one end of a lever arm (2), oscillating means (1) a to oscillate said probe tip substantially based on the fundamental frequency of said lever arm, said system including control means (7) for controlling said oscillating mean to vary the oscillation frequency of said tip based on a plurality of harmonics of said lever arm. The invention is characterized in that said control means comprise an input receiving a parameter representing an operating threshold of said system, to vary the oscillation frequency of said tip based on at least one harmonic of said lever arm when said signal corresponds to a state of said system higher than said operating threshold.
摘要翻译： 本发明涉及具有原子力的微观系统，其包括放置在杠杆臂（2）的一端的探针尖端，振荡装置（1），用于基本上基于所述杠杆臂的基本频率摆动所述探针尖端，所述系统 包括控制装置（7），用于根据所述杠杆臂的多个谐波来控制所述振荡平均值以改变所述尖端的振荡频率。 本发明的特征在于，所述控制装置包括接收表示所述系统的操作阈值的参数的输入，当所述信号对应于所述控制臂的状态时，基于所述杠杆臂的至少一个谐波来改变所述尖端的振荡频率 系统高于所述操作阈值。
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3.发明授权Measurement of radiations of high influence by a capacitive element of MOS type 有权通过MOS型电容元件测量高影响的辐射公开(公告)号：US08981308B2
公开(公告)日：2015-03-17
申请号：US13982586
申请日：2012-01-31
IPC分类号： G01T1/02
CPC分类号： G01T1/026
摘要： A method for measuring a dose related to the non-ionizing effects of a radiation of particles comprises the irradiation of a capacitive element provided with an electrode made from a semiconductor material, the measurement of the capacitance of the capacitive element in an accumulation regime and the determination of the dose related to the non-ionizing effects from the measurement of capacitance of the capacitive element in the accumulation regime.
摘要翻译： 用于测量与颗粒辐射的非电离效应有关的剂量的方法包括：设置有由半导体材料制成的电极的电容元件的照射，蓄积状态下的电容元件的电容的测量以及 通过测量蓄积体系中的电容元件的电容，确定与非电离效应有关的剂量。
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4.发明申请MEASUREMENT OF RADIATIONS OF HIGH INFLUENCE BY A CAPACITIVE ELEMENT OF MOS TYPE 有权MOS型电容元件对高影响辐射的测量公开(公告)号：US20140034841A1
公开(公告)日：2014-02-06
申请号：US13982586
申请日：2012-01-31
IPC分类号： G01T1/02
CPC分类号： G01T1/026
摘要： A method for measuring a dose related to the non-ionizing effects of a radiation of particles comprises the irradiation of a capacitive element provided with an electrode made from a semiconductor material, the measurement of the capacitance of the capacitive element in an accumulation regime and the determination of the dose related to the non-ionizing effects from the measurement of capacitance of the capacitive element in the accumulation regime.
摘要翻译： 用于测量与颗粒辐射的非电离效应有关的剂量的方法包括：设置有由半导体材料制成的电极的电容元件的照射，蓄积状态下的电容元件的电容的测量以及 通过测量蓄积体系中的电容元件的电容，确定与非电离效应有关的剂量。
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