公开(公告)号：US5764352A

公开(公告)日：1998-06-09

申请号：US691137

申请日：1996-08-01

申请人： Peter Kappel ,  Werner Lenz ,  Walter Muller ,  Christian Schaffer ,  Wilhelm Schebesta ,  Ulrich Basler ,  Jens Mondry ,  Jurgen Gobel

发明人： Peter Kappel ,  Werner Lenz ,  Walter Muller ,  Christian Schaffer ,  Wilhelm Schebesta ,  Ulrich Basler ,  Jens Mondry ,  Jurgen Gobel

IPC分类号： G01J3/02 ,  G01M11/00 ,  G01N21/27 ,  G01N21/47 ,  G01J1/42

CPC分类号： G01N21/958 ,  G01N21/474 ,  G01N21/5907 ,  G01N21/8422

摘要： Optical measuring apparatus for determining chromaticity of thin films on a substrate includes a light source for illuminating the substrate and a measuring apparatus for dispersing light into various wavelengths and making wavelength dependent intensity measurements. Radiation from the light source is reflected or transmitted by the substrate to the measuring apparatus along a first beam path having a first diaphragm for cutting off the radiation from the substrate in a leak-tight manner. Radiation from the light source is also transmitted to the measuring apparatus directly along a second beam path having a second diaphragm for cutting off radiation from the light source in a leak-tight manner. The light source (6a) consists of a globe photometer (6a), in which a lamp (4) is provided. A steadily burning light source, especially a halogen lamp, is used as the lamp (4). Long-term instabilities are corrected essentially by means of a white reference standard, whereas short-term instabilities are corrected under consideration of the characteristic emission spectrum of the selected lamp (4). For determining the chromaticity of reflecting and transparent thin-film layers applied to substrate, a process for reflectance curve determination is used, in which apparatus-related instabilities interfering with the chromaticity measurement are corrected by normalization of the measured relative spectral energy distributions to the current measurement light spectrum and by taking into consideration the effects of foreign light on the measurement light spectrum.

摘要翻译： 用于确定基板上的薄膜的色度的光学测量装置包括用于照射基板的光源和用于将光分散到各种波长并进行波长依赖的强度测量的测量装置。 来自光源的辐射被基板反射或传输到具有第一光阑的第一光束路径的测量装置，该第一光阑用于以不透气的方式切断来自基板的辐射。 来自光源的辐射也沿着具有第二光阑的第二光束路径直接传送到测量装置，用于以不透漏的方式切断来自光源的辐射。 光源（6a）由球状光度计（6a）组成，其中设置有灯（4）。 使用稳定燃烧的光源（特别是卤素灯）作为灯（4）。 长期不稳定性基本上通过白色参考标准进行校正，而在考虑所选择的灯（4）的特征发射光谱的情况下校正短期不稳定性。 为了确定施加到基板的反射和透明薄膜层的色度，使用反射曲线确定的处理，其中通过将测量的相对光谱能量分布归一化为电流来校正与色度测量相干扰的与装置有关的不稳定性 测量光谱，并考虑到异物对测量光谱的影响。

公开(公告)号：US5913430A

公开(公告)日：1999-06-22

申请号：US797260

申请日：1997-02-07

申请人： Jurgen Gobel ,  Joachim Peuckert

发明人： Jurgen Gobel ,  Joachim Peuckert

IPC分类号： A61B50/20 ,  A61B50/22 ,  A47F7/00

CPC分类号： A61B50/22 ,  A61B50/20 ,  A61B90/70

摘要： There is disclosed a rack with receptacles for medical forceps. The forceps comprise a forceps jaw at the distal end of a shank and a handle with two scissor type grips which can be spread apart for opening the forceps jaw. To each of the receptacles arranged parallel to one another, in each case, there are allocated two grip supports fixing the grips in their spread apart position, a shank support for the shank and two lateral supports for the handle. This achieves the object that after the insertion into the rack has been effected, the opened forceps jaw parts cannot close.

摘要翻译： 公开了一种具有用于医疗镊子的插座的机架。 镊子包括在柄的远端处的钳子钳口和具有两个剪刀式把手的把手，其可以分开以打开镊子钳口。 对于彼此平行布置的每个插座，在每种情况下，分配有两个抓握支撑件，将手柄固定在其展开位置，用于柄的柄支撑件和用于手柄的两个侧向支撑件。 这实现了在插入到机架中之后，打开的钳子爪部件不能闭合的目的。