METHOD OF MEASURING DEPOSITION ONTO A SUBSTRATE
    1.
    发明申请
    METHOD OF MEASURING DEPOSITION ONTO A SUBSTRATE 有权
    测量沉积在基底上的方法

    公开(公告)号:US20100212410A1

    公开(公告)日:2010-08-26

    申请号:US12160807

    申请日:2008-06-24

    IPC分类号: G01N5/02

    摘要: A method of measuring the deposition of a composition onto a substrate. This information can be used to correlate how the composition will deposit on sanitary ware, such as shower cubicles, baths, and wash basins. The composition can be a liquid personal cleansing composition.

    摘要翻译: 测量组合物沉积到基底上的方法。 该信息可用于关联组合物如何在诸如淋浴间,浴室和洗脸盆等卫生洁具上沉积。 组合物可以是液体个人清洁组合物。

    Method of measuring deposition onto a substrate
    2.
    发明授权
    Method of measuring deposition onto a substrate 有权
    测量沉积在基底上的方法

    公开(公告)号:US08015860B2

    公开(公告)日:2011-09-13

    申请号:US12160807

    申请日:2008-06-24

    IPC分类号: G01N5/02

    摘要: A method of measuring the deposition of a composition onto a substrate. This information can be used to correlate how the composition will deposit on sanitary ware, such as shower cubicles, baths, and wash basins. The composition can be a liquid personal cleansing composition.

    摘要翻译: 测量组合物沉积到基底上的方法。 该信息可用于关联组合物如何在诸如淋浴间,浴室和洗脸盆等卫生洁具上沉积。 组合物可以是液体个人清洁组合物。