利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

3 条记录 (耗时 0.043 秒)

    METHOD FOR INDICATING A CHARACTERISTIC OF BONE MINERAL DENSITY
    2.
    发明申请
    METHOD FOR INDICATING A CHARACTERISTIC OF BONE MINERAL DENSITY 有权
    表征骨矿物质密度特征的方法

    公开(公告)号：US20100215229A1

    公开(公告)日：2010-08-26

    申请号：US12678648

    申请日：2008-09-09

    申请人： Philip Daniel Allen ,  Keith Horner ,  Jim Graham ,  Hugh Devlin

    发明人： Philip Daniel Allen ,  Keith Horner ,  Jim Graham ,  Hugh Devlin

    IPC分类号： G06K9/62 ,  G01N23/06

    CPC分类号： G06T7/0012

    摘要： A method of generating an indication of at least one characteristic of a patient's bone mineral density. The method comprises obtaining at least one measurement of a width of a patient's inferior mandibular cortex and generating said indication based upon said at least one measurement. The at least one measurement is obtained at a location along the inferior mandibular cortex between the ante-gonion and a point on the inferior mandibular cortex defined with reference to the mental foramen.

    摘要翻译： 一种产生患者骨矿物质密度的至少一种特征的指示的方法。 该方法包括获得患者的下颌下皮的宽度的至少一个测量值，并基于所述至少一个测量产生所述指示。 在沿着下颌下皮层的位置处获得至少一个测量值，其位于前房与下颌下皮层上相对于心孔确定的点之间。

    Optical metrology
    3.
    发明授权
    Optical metrology 失效
    光学计量学

    公开(公告)号：US4725884A

    公开(公告)日：1988-02-16

    申请号：US864789

    申请日：1986-05-19

    申请人： Andrew W. Gurnell ,  Keith Horner ,  Richard R. Jackson

    发明人： Andrew W. Gurnell ,  Keith Horner ,  Richard R. Jackson

    IPC分类号： G01B11/02 ,  H04N7/00 ,  H04N7/18

    CPC分类号： G01B11/022

    摘要： A method and apparatus for measuring the width of a small object between a pair of opposed edges thereof e.g. the width of a line on a semiconductor wafer, having a light microscope, a video system for receiving an optical image from the microscope and for displaying the image on a display surface having a reference datum, and an optical system for transmitting the optical image from the light microscope to the video system. In order to measure the width of the line of the wafer, relative adjustment is carried out between the optical system and the object to a first measuring position in which the image is moved across the display surface until a predetermined intensity level of one of the edges of the line is brought to a predetermined position relative to the reference datum. Further relative adjustment is then carried out to a second measuring position in which a further predetermined intensity level of the other edge of the object is brought to a predetermined position relative to the reference datum. The extent of adjustment movement is then measured, so as to provide a value which corresponds with the width of the object to be measured between the opposed edges thereof. The reference datum will be positioned on a detecting surface at a position where substantially distortion-free images can be produced i.e. remote from the edges of the screen, and then the images are moved relative to this datum, so an accurate inspection can be carried out.

    摘要翻译： 一种在一对相对边缘之间测量小物体的宽度的方法和装置，例如， 具有光学显微镜的半导体晶片上的线的宽度，用于从显微镜接收光学图像并用于在具有参考基准的显示表面上显示图像的视频系统，以及用于将光学图像从 光学显微镜到视频系统。 为了测量晶片线的宽度，在光学系统和物体之间进行相对调整到第一测量位置，在该第一测量位置，图像在显示表面上移动直到其中一个边缘的预定强度水平 的线被带到相对于参考基准的预定位置。 然后进一步相对调整到第二测量位置，其中物体的另一边缘的另一预定强度水平相对于参考基准被带到预定位置。 然后测量调节运动的程度，以便提供与被测量物体在其相对边缘之间的宽度相对应的值。 参考数据将位于检测表面上，该位置可以产生基本上无失真的图像，即远离屏幕边缘，然后相对于该数据移动图像，因此可以执行准确的检查 。