Method for forming semiconductor device
    1.
    发明申请
    Method for forming semiconductor device 审中-公开
    半导体器件形成方法

    公开(公告)号:US20080311715A1

    公开(公告)日:2008-12-18

    申请号:US12068617

    申请日:2008-02-08

    IPC分类号: H01L21/8236

    摘要: A method for forming a semiconductor device is disclosed. A substrate comprising trenches are provided. Dopants are doped into a region of the substrate neighboring a sidewall of the trenches by using an isotropic doping method. A gate dielectric layer is formed on the sidewall of the substrate. A gate electrode is formed in the trenches, wherein the gate electrode protrudes a surface of the substrate.

    摘要翻译: 公开了一种用于形成半导体器件的方法。 提供了包括沟槽的衬底。 通过使用各向同性掺杂方法将掺杂剂掺杂到与沟槽的侧壁相邻的衬底的区域中。 栅介质层形成在衬底的侧壁上。 在沟槽中形成栅电极,其中栅电极突出基片的表面。

    Semiconductor device having a composite passivation layer and method of manufacturing the same
    2.
    发明申请
    Semiconductor device having a composite passivation layer and method of manufacturing the same 审中-公开
    具有复合钝化层的半导体器件及其制造方法

    公开(公告)号:US20070298547A1

    公开(公告)日:2007-12-27

    申请号:US11510937

    申请日:2006-08-28

    摘要: A semiconductor device and a method of manufacturing the same are provided. The semiconductor device comprises a fuse bank with a fuse window, a pad area with a pad window, and a composite passivation layer comprising a sacrificial dielectric layer and a final passivation layer. Both the fuse window and the pad window have a bottom portion and two sidewalls, and the composite passivation layer covers both the fuse bank and the pad area except for the bottom portions of the fuse bank and the pad area.

    摘要翻译: 提供半导体器件及其制造方法。 半导体器件包括具有熔丝窗口的熔丝组,具有焊盘窗口的焊盘区域以及包括牺牲绝缘层和最终钝化层的复合钝化层。 熔丝窗口和焊盘窗口都具有底部和两个侧壁,并且复合钝化层覆盖熔丝排和焊盘区域,除了保险丝组的底部和焊盘区域之外。