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公开(公告)号:US20240402772A1
公开(公告)日:2024-12-05
申请号:US18329394
申请日:2023-06-05
Applicant: QUALCOMM INCORPORATED
Inventor: Darshan Kumar NANDANWAR , Kartik Gunvantbhai DESAI , Raghava Rao MV
Abstract: A system for performing predictive run-time thermal mitigation in a processor uses at least a first temperature sensor and a first power sensor or meter to measure a junction temperature, TJUNC, value and power consumption, PTOTAL, value in the processor and predicts what a temperature, TEMPPRED, value of the processor will be in a later clock cycle of the processor based at least in part on the TJUNC and PTOTAL values. If the TEMPPRED value exceeds a preselected temperature threshold, THTEMP, value, one or more thermal mitigation actions are taken to ensure that a future TJUNC value measured n sample periods from the current sample period k of the processor will not exceed the THTEMP value.