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公开(公告)号：US07928745B2
公开(公告)日：2011-04-19
申请号：US12331445
申请日：2008-12-10
申请人： Qiang Qin , Tian-You Liu , Lian-Zhong Gong
发明人： Qiang Qin , Tian-You Liu , Lian-Zhong Gong
IPC分类号： G01R31/00
CPC分类号： G01R31/2829 , G01V13/00
摘要： An endurance testing system is configured to test endurance of a first detecting apparatus. The endurance testing system includes a second detecting apparatus, a movement module, a processor, and a storage module. The movement module includes a first inductive object and a second inductive object. The processor is connected to the first and second detecting apparatuses, and the movement module, for controlling the movement module and counting a first number of times the first detecting apparatus detects the first inductive object, and a second number of times the second detecting apparatus detects the second inductive object. The storage module is connected to the processor, for storing the first and second numbers of times from the processor. The first detecting apparatus fails the testing upon the condition that the first number of times is not equal to the second number of times.
摘要翻译： 耐力测试系统被配置成测试第一检测装置的耐久性。 耐久性测试系统包括第二检测装置，移动模块，处理器和存储模块。 移动模块包括第一感应对象和第二感应对象。 处理器连接到第一和第二检测装置，以及移动模块，用于控制移动模块并计数第一检测装置检测到第一感应对象的第一次，以及第二次检测装置检测到的次数 第二感应对象。 存储模块连接到处理器，用于从处理器存储第一次和第二次。 在第一次次数不等于第二次的情况下，第一检测装置不能进行测试。
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公开(公告)号：US07816920B2
公开(公告)日：2010-10-19
申请号：US12178652
申请日：2008-07-24
申请人： Qiang Qin , Tian-You Liu , Lian-Zhong Gong
发明人： Qiang Qin , Tian-You Liu , Lian-Zhong Gong
IPC分类号： G01V3/08
摘要： An exemplary metal detector includes a detecting circuit, a SCM, a converting circuit, and a cymometer. The SCM cooperates with the detecting circuit to generate a current signal with a specific frequency, the converting circuit transforms the current signal received from the SCM to a voltage signal, and the cymometer displays a value of a frequency of the current signal according to the voltage signal. When the detecting circuit detects a metal nearby, the value of the frequency of the current signal displayed on the cymometer changes.
摘要翻译： 示例性金属检测器包括检测电路，SCM，转换电路和电流计。 SCM与检测电路配合产生具有特定频率的电流信号，转换电路将从SCM接收的电流信号转换为电压信号，并且电流计根据电压显示电流信号的频率值 信号。 当检测电路检测到附近的金属时，显示在电流计上的电流信号的频率值发生变化。
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公开(公告)号：US07763839B2
公开(公告)日：2010-07-27
申请号：US12118683
申请日：2008-05-10
申请人： Qiang Qin , Tian-You Liu , Lian-Zhong Gong
发明人： Qiang Qin , Tian-You Liu , Lian-Zhong Gong
CPC分类号： G01J1/44 , G01J1/02 , G01J1/0219
摘要： A luminous intensity measuring device includes a photoresistor, a number of voltage-dividing resistors, a plurality of comparators, a micro control unit (MCU), and an indicator. The photoresistor is connected to a current-limiting resistor in series between a direct current (DC) power supply and ground. The voltage-dividing resistors are connected in series, and together are connected parallel to the photoresistor and the current-limiting resistor located between the DC power supply and ground. A non-inverting node between the photoresistor and the current-limiting resistor is connected to the non-inverting input terminals of the comparators. The inverting terminals of the comparators are respectively connected to inverting nodes between every two adjacent voltage-dividing resistors. The output terminals of the comparators are connected to the input terminals of the MCU. The indicator is connected to the output terminals of the MCU. The MCU controls the indicator to indicate luminous intensity.
摘要翻译： 发光强度测量装置包括光电晶体管，多个分压电阻器，多个比较器，微控制单元（MCU）和指示器。 光敏电阻连接到直流（DC）电源和地之间串联的限流电阻。 分压电阻串联连接，并联在与直流电源和地之间的光敏电阻和限流电阻之间并联。 光敏电阻和限流电阻之间的非反相节点连接到比较器的非反相输入端。 比较器的反相端子分别连接到每两个相邻的分压电阻之间的反相节点。 比较器的输出端子连接到MCU的输入端子。 指示灯连接到MCU的输出端子。 MCU控制指示灯指示发光强度。
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