Abstract:
Apparatus for testing the linearity of a circuit includes means for applying a staircase waveform to the circuit under test. The staircase waveform has known ratios between the values of one step and the remaining steps. The staircase waveform as altered by the circuit under test has unknown ratios between the one altered step and the remaining altered steps. Means are provided for determining the ratios of the one step to the remaining steps of the altered staircase waveform and for comparing these ratios to the known ratios existing in the original waveform. The difference between these ratios, if any, is determined and provides by way of a ratio comparator an indication of the linearity of the circuit under test.