公开(公告)号：US20180364676A1

公开(公告)日：2018-12-20

申请号：US16008415

申请日：2018-06-14

Applicant: RENISHAW PLC

Inventor： Michael WOOLDRIDGE ,  Paul MOORE ,  John OULD

IPC: G05B19/401 ,  G01B21/04

Abstract: A method of scanning an object using an analogue probe mounted on a machine tool, so as to collect scanned measurement data along a nominal measurement line on the surface of the object, the analogue probe having a preferred measurement range. The method includes controlling the analogue probe and/or object to perform a scanning operation in accordance with a course of relative motion, the course of relative motion being configured such that, based on assumed properties of the surface of the object, the analogue probe will be caused to obtain data within its preferred measuring range, as well as cause the analogue probe to go outside its preferred measuring range, along the nominal measurement line on the surface of the object.