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1.发明授权Method and system for determining repeatable yield detractors of integrated circuits 失效用于确定集成电路的可重复产量剔除器的方法和系统公开(公告)号：US06971054B2
公开(公告)日：2005-11-29
申请号：US10138992
申请日：2002-05-02
IPC分类号： G01R31/3185 , G01R31/28 , G11C29/00
CPC分类号： G01R31/3185
摘要： An exemplary embodiment of the present invention is a method for testing an integrated circuit. The method includes generating a test pattern and generating a reference signature corresponding to the test pattern. An integrated circuit test is executed in response to the test pattern and a result signature is generated in response to data output from executing the integrated circuit test. The result signature is compared to the reference signature and a current failing signature is created if the two don't match. The current failing signature is copy of the result signature. Common error analysis is executed in response to creating the current failing signature. Additional embodiments include a system and storage medium for testing an integrated circuit.
摘要翻译： 本发明的示例性实施例是用于测试集成电路的方法。 该方法包括生成测试图案并生成与测试图案相对应的参考签名。 响应于测试模式执行集成电路测试，并且响应于执行集成电路测试的数据输出而产生结果签名。 将结果签名与参考签名进行比较，如果两者不匹配，则创建当前失败的签名。 当前失败的签名是结果签名的副本。 响应于创建当前失败的签名执行常见错误分析。 另外的实施例包括用于测试集成电路的系统和存储介质。
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2.发明申请SIGNATURE COMPRESSION REGISTER INSTABILITY ISOLATION AND STABLE SIGNATURE MASK GENERATION FOR TESTING VLSI CHIPS 有权签名压缩寄存器不稳定性隔离和稳定签名面板生成测试VLSI CHIPS公开(公告)号：US20140006889A1
公开(公告)日：2014-01-02
申请号：US13534444
申请日：2012-06-27
IPC分类号： G01R31/3177 , G06F11/25
CPC分类号： G06F11/27 , G01R31/318547 , G01R31/3193
摘要： A method for detecting unstable signatures when testing a VLSI chip that includes adding to an LFSR one or more save and restore registers for storing an initial seed consisting of 0s and 1s; loading the initial seed into the one or more save and restoring LFSR registers upon reaching a predetermined number of test loops; performing a signature stability test by loading said initial seed to said LFSR, executing the predetermined number of BIST test loops, and comparing the resulting MISR signature for differences versus a previous signature stored in a MISR save and restore register.
摘要翻译： 一种用于在测试VLSI芯片时检测不稳定签名的方法，包括向LFSR添加一个或多个保存和恢复寄存器以存储由0和1组成的初始种子; 在达到预定数量的测试循环时将初始种子加载到一个或多个保存和恢复LFSR寄存器中; 通过将所述初始种子加载到所述LFSR来执行签名稳定性测试，执行预定数量的BIST测试循环，以及将差异的差异的MISR签名与存储在MISR保存和恢复寄存器中的先前签名进行比较。
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3.发明授权Signature compression register instability isolation and stable signature mask generation for testing VLSI chips 有权签名压缩寄存器不稳定隔离和稳定的签名掩码生成用于测试VLSI芯片公开(公告)号：US08843797B2
公开(公告)日：2014-09-23
申请号：US13534444
申请日：2012-06-27
IPC分类号： G01R31/28 , G06F11/27 , G01R31/3193
CPC分类号： G06F11/27 , G01R31/318547 , G01R31/3193
摘要： A method for detecting unstable signatures when testing a VLSI chip that includes adding to an LFSR one or more save and restore registers for storing an initial seed consisting of 0s and 1s; loading the initial seed into the LFSR and one or more save and restore registers; initializing a MISR and running test loops. Upon reaching a predetermined number of test loops, moving a signature of the MISR to a shadow register; then, performing a signature stability test by loading the initial seed to the LFSR; executing the predetermined number of BIST test loops, and comparing a resulting MISR signature for differences versus a previous signature stored in a MISR save and restore register, wherein unloading is performed by way of serial MISR unloads and single bit XORs.
摘要翻译： 一种用于在测试VLSI芯片时检测不稳定签名的方法，包括向LFSR添加一个或多个保存和恢复寄存器以存储由0和1组成的初始种子; 将初始种子加载到LFSR和一个或多个保存和恢复寄存器; 初始化MISR并运行测试循环。 当达到预定数量的测试循环时，将MISR的签名移动到影子寄存器; 然后，通过将初始种子加载到LFSR来执行签名稳定性测试; 执行预定数量的BIST测试循环，并且将差异的结果MISR签名与存储在MISR保存和恢复寄存器中的先前签名进行比较，其中通过串行MISR卸载和单位异或来执行卸载。
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