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公开(公告)号:US06618536B1
公开(公告)日:2003-09-09
申请号:US09446027
申请日:2000-04-04
IPC分类号: G02B610
CPC分类号: G01N21/7703 , G02B6/305 , G02F1/035
摘要: In at least part of the layers of the integrated optical channel waveguide system, such as cladding layers, a passive light guiding layer and an active light guiding layer, an adiabatic layer thickness transition positioned next to a working zone is used to adapt the waveguide structure in the working zones to individually optimized functionality. In this way, the relative layer thickness values as located in the working area, for example a sensor window, a modulation region and a fiber-chip region, can be individually optimized, for example, for maximal evanescent field sensitivity, for minimal modulation voltage and for efficient coupling of light power without the necessity of the optical layer-thickness values elsewhere in the system having to be adjusted. Incorporated in a Mach-Zehnder interferometer this results in an exceptionally sensitive and reliable sensor. Preferably the channel waveguide system is incorporated in an electronic circuitry in which e.g. a phase shift induced by the quantity to be determined is generated.
摘要翻译: 在诸如包覆层,无源光导层和有源光导层之类的集成光通道波导系统的至少一部分层中,使用位于工作区旁边的绝热层厚度变化来使波导结构 在工作区内单独优化功能。 以这种方式,位于工作区域(例如传感器窗口,调制区域和光纤芯片区域)中的相对层厚度值可以单独优化,例如,对于最小消逝场灵敏度,对于最小调制电压 并且用于光功率的有效耦合,而不需要在系统中的其他地方必须调整光学层厚度值。 结合在马赫 - 策德尔干涉仪中,这导致了一个非常敏感和可靠的传感器。 优选地,信道波导系统结合在电子电路中,其中例如 产生由待确定的量引起的相移。