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公开(公告)号：US08552734B2
公开(公告)日：2013-10-08
申请号：US11911732
申请日：2006-04-13
IPC分类号： G01R31/08
CPC分类号： G01R31/31721 , G01R31/318533
摘要： The integrated circuit (10) has an internal power supply domain with a power supply voltage adaptation circuit (14) to adapt the power supply voltage in the power supply domain. Typically, a plurality of such domains is provided wherein the power supply voltage can be adapted independently. During testing an internal power supply voltage is supplied to a temporally integrating analog to digital conversion circuit (16) in the integrating circuit (10). A temporally integrated value of the power supply voltage is measured during a measurement period. Preferably, integrating measurements of a plurality of internal supply voltages are performed in parallel during the same measurement time interval. Preferably a further test is performed by changing over between mutually different supply voltages during a further measurement period. In this way the measured integrated supply voltage can be used to check the speed of the change over between the different voltages.
摘要翻译： 集成电路（10）具有内部电源域，其具有电源电压适配电路（14），以适应供电域中的电源电压。 通常，提供多个这样的域，其中可以独立地适配电源电压。 在测试期间，内部电源电压被提供给积分电路（10）中的时间积分模数转换电路（16）。 在测量期间测量电源电压的时间积分值。 优选地，在相同的测量时间间隔期间并行地执行多个内部电源电压的积分测量。 优选地，在另外的测量周期期间通过在相互不同的电源电压之间切换来执行另外的测试。 以这种方式，可以使用测量的集成电源电压来检查不同电压之间的转换速度。
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公开(公告)号：US20100013493A1
公开(公告)日：2010-01-21
申请号：US11911732
申请日：2006-04-13
IPC分类号： G01R31/3185
CPC分类号： G01R31/31721 , G01R31/318533
摘要： The integrated circuit (10) has an internal power supply domain with a power supply voltage adaptation circuit (14) to adapt the power supply voltage in the power supply domain. Typically, a plurality of such domains is provided wherein the power supply voltage can be adapted independently. During testing an internal power supply voltage is supplied to a temporally integrating analog to digital conversion circuit (16) in the integrating circuit (10). A temporally integrated value of the power supply voltage is measured during a measurement period. Preferably, integrating measurements of a plurality of internal supply voltages are performed in parallel during the same measurement time interval. Preferably a further test is performed by changing over between mutually different supply voltages during a further measurement period. In this way the measured integrated supply voltage can be used to check the speed of the change over between the different voltages.
摘要翻译： 集成电路（10）具有内部电源域，其具有电源电压适配电路（14），以适应供电域中的电源电压。 通常，提供多个这样的域，其中可以独立地适配电源电压。 在测试期间，内部电源电压被提供给积分电路（10）中的时间积分模数转换电路（16）。 在测量期间测量电源电压的时间积分值。 优选地，在相同的测量时间间隔期间并行地执行多个内部电源电压的积分测量。 优选地，在另外的测量周期期间通过在相互不同的电源电压之间切换来执行另外的测试。 以这种方式，可以使用测量的集成电源电压来检查不同电压之间的转换速度。
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公开(公告)号：US08138783B2
公开(公告)日：2012-03-20
申请号：US12440448
申请日：2007-09-04
IPC分类号： G01R31/02
CPC分类号： G01R31/3008
摘要： A circuit portion (100) of an IC comprises a plurality of conductive tracks (130) for coupling respective circuit portion elements (150), e.g. standard logic cells, to a power supply rail (110), with the conductive tracks (130) being coupled to the power supply rail (110) via at least one enable switch (132). The circuit portion (100) further comprising an element (160) for determining a voltage gradient over the circuit portion (100) in a test mode of the integrated circuit (600), which is conductively coupled to the conductive tracks (130). The element (160) has a first end portion (164) for coupling the element (160) to the power supply terminal and a second end portion (166) for coupling the element (160) to the output (620) in the test mode. This facilitates IDDQ testing of the circuit portion (100) by means of measuring a voltage gradient over the element (160).
摘要翻译： IC的电路部分（100）包括用于耦合各个电路部分元件（150）的多个导电轨道（130），例如， 标准逻辑单元到达电源轨道（110），其中导电轨道（130）经由至少一个启用开关（132）耦合到电源轨道（110）。 电路部分（100）还包括用于在集成电路（600）的测试模式中确定电路部分（100）上的电压梯度的元件（160），该电流部分导电地耦合到导电轨道（130）。 元件（160）具有用于将元件（160）耦合到电源端子的第一端部（164）和用于在测试模式下将元件（160）耦合到输出（620）的第二端部（166） 。 这通过测量元件（160）上的电压梯度来促进电路部分（100）的IDDQ测试。
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4.发明授权公开(公告)号：US08185215B2
公开(公告)日：2012-05-22
申请号：US12531726
申请日：2008-03-26
CPC分类号： G06F1/3203 , Y02D10/126
摘要： An electronic device is provided with at least one functional unit (HB) performing a processing, wherein the functional unit (HB) receives a supply current (Isupply). A supply current monitor (SCM) is provided for monitoring the supply current (Isupply) to determine an average supply current (Iavg). A characterization unit (CU) is provided for determining a first relation between the averaged supply current (Iavg) and an operation frequency of the functional unit and/or for determining a second relation between a workload of the functional unit (HB) and the average supply current (Iavg) of the functional unit (HB). Furthermore, a slope calculation unit (SCU) is provided for determining the slope of the first and/or second relation. The operation of the functional unit (HB) is controlled according to the results of the slope calculation unit (SCU).
摘要翻译： 电子设备具有执行处理的至少一个功能单元（HB），其中功能单元（HB）接收供电电流（Isupply）。 提供电源电流监视器（SCM）用于监视电源电流（Isupply）以确定平均电源电流（Iavg）。 提供表征单元（CU），用于确定平均的电源电流（Iavg）和功能单元的操作频率之间的第一关系和/或用于确定功能单元（HB）的工作负载与平均值之间的第二关系 供电电流（Iavg）功能单元（HB）。 此外，提供斜率计算单元（SCU），用于确定第一和/或第二关系的斜率。 功能单元（HB）的操作根据斜率计算单元（SCU）的结果进行控制。
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5.发明申请公开(公告)号：US20100087964A1
公开(公告)日：2010-04-08
申请号：US12531726
申请日：2008-03-26
IPC分类号： G06F1/28
CPC分类号： G06F1/3203 , Y02D10/126
摘要： An electronic device is provided with at least one functional unit (HB) performing a processing, wherein the functional unit (HB) receives a supply current (Isupply). A supply current monitor (SCM) is provided for monitoring the supply current (Isupply) to determine an average supply current (Iavg). A characterization unit (CU) is provided for determining a first relation between the averaged supply current (Iavg) and an operation frequency of the functional unit and/or for determining a second relation between a workload of the functional unit (HB) and the average supply current (Iavg) of the functional unit (HB). Furthermore, a slope calculation unit (SCU) is provided for determining the slope of the first and/or second relation. The operation of the functional unit (HB) is controlled according to the results of the slope calculation unit (SCU).
摘要翻译： 电子设备具有执行处理的至少一个功能单元（HB），其中功能单元（HB）接收供电电流（Isupply）。 提供电源电流监视器（SCM）用于监视电源电流（Isupply）以确定平均电源电流（Iavg）。 提供表征单元（CU），用于确定平均的电源电流（Iavg）和功能单元的操作频率之间的第一关系和/或用于确定功能单元（HB）的工作负载与平均值之间的第二关系 供电电流（Iavg）功能单元（HB）。 此外，提供斜率计算单元（SCU），用于确定第一和/或第二关系的斜率。 功能单元（HB）的操作根据斜率计算单元（SCU）的结果进行控制。
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