摘要:
An apparatus for monitoring and controlling electrical parameter of an imaging surface, the monitoring controlling apparatus including a patch generator for recording a first control patch at a first voltage level and a second control patch at a second voltage level on the imaging surface; electrostatic voltmeter for measuring voltage potentials associated with the first control patch and second control patch. A processor, in communication with the patch generator, calculates the electrical parameters of the imaging surface from the measured voltage potentials from the first and second control patches. The processor determines a deviation between the calculated electrical parameters values and setup values. Then, the processor produces and sends a feedback error signal to the patch generator if the deviation exceed a threshold level. The patch generator records a third control patch at a third voltage level on the imaging surface upon reception of the error signal. The ESV senses the third control patch. The processor calculates the electrical parameters of the imaging surface from the measured voltage potential of the third control patch and determines a correction factor. The charging device, exposure system and developer are adjusted in accordance to the correction factor.
摘要:
There is provided a method for use with a printing machine having a movable imaging member and a projecting system for modulating a beam and projecting an image into the movable imaging member. The printing machine further includes a developer for application of developer material to the image projected onto the movable imaging member for transfer of the image to a print media sheet. The method, which is intended for use in controlling exposure of a test patch on the movable imaging member includes the steps of: a) providing a time-keeping device with the time-keeping device including a variable value which is either incrementable or decrementable; b) detecting a signal indicating that the movable imaging member is positioned relative to the beam in a selected orientation, wherein the movable imaging member passes by the beam at a selected speed; c) providing a reference value with the reference value varying as a function of the selected speed; d) in response to the detecting of (b), modulating the beam, relative to the movable imaging member, so as to expose a portion for the test patch; e) concurrent with the modulating of (d), incrementing or decrementing the variable value of the time keeping device; and f) repeating said modulating of (d) until the value of the variable value is about equal to the reference value and the test patch is exposed.