CIRCULARITY MEASURING APPARATUS AND MEASUREMENT VALUE CORRECTING METHOD FOR CIRCULARITY MEASURING METHOD
    1.
    发明申请
    CIRCULARITY MEASURING APPARATUS AND MEASUREMENT VALUE CORRECTING METHOD FOR CIRCULARITY MEASURING METHOD 有权
    圆度测量方法的循环测量装置和测量值校正方法

    公开(公告)号:US20120185210A1

    公开(公告)日:2012-07-19

    申请号:US13349016

    申请日:2012-01-12

    Applicant: Ryo TAKANASHI

    Inventor: Ryo TAKANASHI

    Abstract: According to the present invention, a center deviation amount, which is an amount of deviation (distance) between the center line of a reference measurement target and the detection point is calculated using the reference measurement target having a known diameter, and a measurement value of a diameter of an arbitrary measurement target is corrected using the center deviation amount. Therefore, an accurate diameter value can be calculated even in the case of a measurement target having a diameter value different from the diameter value of the reference measurement target.

    Abstract translation: 根据本发明,使用具有已知直径的基准测量对象来计算作为基准测量对象的中心线与检测点之间的偏差量(距离)的中心偏差量,测定值 使用中心偏差量来校正任意测量对象的直径。 因此,即使在具有与基准测定对象的直径值不同的直径值的测定对象的情况下,也可以算出准确的直径值。

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