公开(公告)号：US12108026B2

公开(公告)日：2024-10-01

申请号：US17730514

申请日：2022-04-27

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Ji Hun Shin ,  Se-Jun Kim ,  Bu Yong Um ,  Young Tae Jang

IPC: H04N17/02 ,  H04N17/00 ,  H04N23/54 ,  H04N23/667

CPC classification number: H04N17/002 ,  H04N23/54 ,  H04N23/667

Abstract: A method of operating an image sensing device includes applying control voltages to a pixel array in accordance with a test mode and performing an analog-to-digital conversion of a column line voltage to obtain one or more digital codes. The one or more digital codes are evaluated to detect an operating error associated with the column line and/or corresponding analog to digital converter. In response to an operating error, pixel values may be replaced or averaged with nearby pixel outputs not affected by the operating error.

公开(公告)号：US11363252B2

公开(公告)日：2022-06-14

申请号：US17036908

申请日：2020-09-29

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Ji Hun Shin ,  Se-Jun Kim ,  Bu Yong Um ,  Young Tae Jang

IPC: H04N17/00 ,  H04N17/02 ,  H04N5/232 ,  H04N5/225

Abstract: A method of operating an image sensing device includes applying control voltages to a pixel array in accordance with a test mode and performing an analog-to-digital conversion of a column line voltage to obtain one or more digital codes. The one or more digital codes are evaluated to detect an operating error associated with the column line and/or corresponding analog to digital converter. In response to an operating error, pixel values may be replaced or averaged with nearby pixel outputs not affected by the operating error.