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公开(公告)号：US11189651B2
公开(公告)日：2021-11-30
申请号：US16840663
申请日：2020-04-06
发明人： Kang Sun Lee , Seung Ho Shin , Hyung Jin Bae , Jin Ho Seo , Ji Hun Shin , Moo Sup Lim , Young Tae Jang , Young Kyun Jeong
IPC分类号： H01L27/146 , H04N5/355 , H04N5/353 , H04N5/3745 , H01L31/0203
摘要： An image sensor including: a first photodiode; a first circuit including an overflow transistor and a first transfer transistor connected to the first photodiode, a switch element connected to the first transfer transistor and a capacitor disposed between the first transfer transistor and the switch element, wherein the capacitor is a physical capacitor; a second photodiode; and a second circuit including a second transfer transistor connected to the second photodiode, a reset transistor connected to an output of the first circuit and a driving transistor connected to the second transfer transistor and the output of the first circuit.
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公开(公告)号：US20180295297A1
公开(公告)日：2018-10-11
申请号：US16003577
申请日：2018-06-08
发明人： Byung Jo Kim , Seog Heon Ham , Sung Ho Suh , Se Jun Kim , Young Tae Jang
IPC分类号： H04N5/347 , H04N9/04 , H04N5/378 , H04N5/3745
CPC分类号： H04N5/347 , H04N5/37457 , H04N5/378 , H04N9/045
摘要： An image sensor includes a pixel array and N analog-to-digital converters (ADCs). The pixel array includes N pixels arranged in each of a plurality of rows, and each of the N pixels include M photoelectric conversion elements. At least one of the N ADCs are shared by at least one of the M photoelectric conversion elements included in each of the N pixels.
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公开(公告)号：US12108026B2
公开(公告)日：2024-10-01
申请号：US17730514
申请日：2022-04-27
发明人： Ji Hun Shin , Se-Jun Kim , Bu Yong Um , Young Tae Jang
IPC分类号： H04N17/02 , H04N17/00 , H04N23/54 , H04N23/667
CPC分类号： H04N17/002 , H04N23/54 , H04N23/667
摘要： A method of operating an image sensing device includes applying control voltages to a pixel array in accordance with a test mode and performing an analog-to-digital conversion of a column line voltage to obtain one or more digital codes. The one or more digital codes are evaluated to detect an operating error associated with the column line and/or corresponding analog to digital converter. In response to an operating error, pixel values may be replaced or averaged with nearby pixel outputs not affected by the operating error.
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公开(公告)号：US11658193B2
公开(公告)日：2023-05-23
申请号：US17521218
申请日：2021-11-08
发明人： Kang Sun Lee , Seung Ho Shin , Hyung Jin Bae , Jin Ho Seo , Ji Hun Shin , Moo Sup Lim , Young Tae Jang , Young Kyun Jeong
IPC分类号： H01L27/146 , H04N5/355 , H04N5/353 , H04N5/3745 , H01L31/0203
CPC分类号： H01L27/14616 , H01L27/1463 , H01L27/14603 , H01L27/14634 , H01L27/14641 , H01L27/14643 , H04N5/353 , H04N5/3559 , H04N5/35563 , H04N5/37457 , H01L27/14656 , H01L31/0203
摘要： An image sensor including: a first photodiode; a first circuit including an overflow transistor and a first transfer transistor connected to the first photodiode, a switch element connected to the first transfer transistor and a capacitor disposed between the first transfer transistor and the switch element, wherein the capacitor is a physical capacitor; a second photodiode; and a second circuit including a second transfer transistor connected to the second photodiode, a reset transistor connected to an output of the first circuit and a driving transistor connected to the second transfer transistor and the output of the first circuit.
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公开(公告)号：US09706156B2
公开(公告)日：2017-07-11
申请号：US14518085
申请日：2014-10-20
发明人： Hyeok Jong Lee , Jin Ho Seo , Young Tae Jang , Sung Ho Suh , Jin Young Jeong
CPC分类号： H04N5/76 , H04N3/1593 , H04N5/3415 , H04N5/343 , H04N5/3742
摘要： In one embodiment, an image sensor includes a pixel array including a plurality of pixels, an analog-to-digital converter configured to convert analog pixel signals output from the pixels into digital signals, a first cluster configured to store a first group of digital signals among the digital signals and to output first image data, a second cluster configured to store a second group of digital signals among the digital signals and to output second image data, and at least one cluster switch connected to the first cluster and the second cluster, a first channel, and a second channel. The image sensor is configured to transmit at least one among the first image data and the second image data to at least one among the first channel and the second channel based on an operation mode.
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公开(公告)号：US10469773B2
公开(公告)日：2019-11-05
申请号：US16003577
申请日：2018-06-08
发明人： Byung Jo Kim , Seog Heon Ham , Sung Ho Suh , Se Jun Kim , Young Tae Jang
IPC分类号： H04N5/347 , H04N9/04 , H04N5/3745 , H04N5/378
摘要： An image sensor includes a pixel array and N analog-to-digital converters (ADCs). The pixel array includes N pixels arranged in each of a plurality of rows, and each of the N pixels include M photoelectric conversion elements. At least one of the N ADCs are shared by at least one of the M photoelectric conversion elements included in each of the N pixels.
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公开(公告)号：US09860472B2
公开(公告)日：2018-01-02
申请号：US14990816
申请日：2016-01-08
发明人： Hyeok Jong Lee , Jin Ho Seo , Se Jun Kim , Sung Ho Suh , Young Tae Jang
IPC分类号： H04N5/217 , H04N5/378 , H04N5/347 , H04N5/365 , H04N5/374 , H04N5/3745 , H04N5/335 , H04N5/77
CPC分类号： H04N5/378 , H04N5/347 , H04N5/3658 , H04N5/374 , H04N5/3745 , H04N5/77
摘要： An image sensor operating in a skip mode and reading out a pixel signal provided by at least one of a plurality of pixels and compensating for fixed pattern noise (FPN) in column-parallel pipelines. The image sensor includes; a switch signal generator that generates a first switch control signal and a second switch control signal in response to FPN location information characterizing a first pipeline among the column-parallel pipelines as a noisy pipeline generating FPN, and characterizing a second pipeline among the column-parallel pipelines as a quiet pipeline not generating FPN, a binning switch block including a first switch controlled by the first switch control signal and a second switch controlled by the second switch control signal, wherein the first switch control signal causes the first pipeline to be inactivated and the second switch control signal causes the second pipeline to be activated, and a binning block that performs a digital binning operation on digital signals provided via the column-parallel pipelines including the second pipeline.
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8.发明授权Image sensor for compensating column mismatch and method of processing image using the same 有权用于补偿柱失配的图像传感器和使用该图像处理图像的方法公开(公告)号：US09467634B2
公开(公告)日：2016-10-11
申请号：US14246294
申请日：2014-04-07
发明人： Young Tae Jang , Ju Hyun Ko , Kwang June Sohn , Jin Woo Kim , Min Woo Son , Won Joon Hong
CPC分类号： H04N5/3575 , H04N5/365 , H04N5/378
摘要： An image sensor includes a pixel array, a column signal processor, and a column mismatch compensator. The pixel array outputs a pixel signal from each column line during a pixel measuring time, and outputs a reference signal during a reference measuring time. The column signal processor performs correlated double sampling (CDS) on the reference signal to generate a reference CDS signal, and performs CDS on the pixel signal to generate a pixel CDS signal. The column mismatch compensator compensates the pixel CDS signal based on the reference CDS signal.
摘要翻译： 图像传感器包括像素阵列，列信号处理器和列失配补偿器。 像素阵列在像素测量时间期间从每列输出像素信号，并在参考测量时间期间输出参考信号。 列信号处理器对参考信号执行相关双采样（CDS）以产生参考CDS信号，并对像素信号执行CDS以产生像素CDS信号。 列失配补偿器基于参考CDS信号来补偿像素CDS信号。
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公开(公告)号：US10015414B2
公开(公告)日：2018-07-03
申请号：US14989244
申请日：2016-01-06
发明人： Byung Jo Kim , Seog Heon Ham , Sung Ho Suh , Se Jun Kim , Young Tae Jang
IPC分类号： H04N5/347 , H04N9/04 , H04N5/378 , H04N5/3745
CPC分类号： H04N5/347 , H04N5/37457 , H04N5/378 , H04N9/045
摘要： An image sensor includes a pixel array and N analog-to-digital converters (ADCs). The pixel array includes N pixels arranged in each of a plurality of rows, and each of the N pixels include M photoelectric conversion elements. At least one of the N ADCs are shared by at least one of the M photoelectric conversion elements included in each of the N pixels.
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公开(公告)号：US11363252B2
公开(公告)日：2022-06-14
申请号：US17036908
申请日：2020-09-29
发明人： Ji Hun Shin , Se-Jun Kim , Bu Yong Um , Young Tae Jang
摘要： A method of operating an image sensing device includes applying control voltages to a pixel array in accordance with a test mode and performing an analog-to-digital conversion of a column line voltage to obtain one or more digital codes. The one or more digital codes are evaluated to detect an operating error associated with the column line and/or corresponding analog to digital converter. In response to an operating error, pixel values may be replaced or averaged with nearby pixel outputs not affected by the operating error.
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