公开(公告)号：US11112451B2

公开(公告)日：2021-09-07

申请号：US16296954

申请日：2019-03-08

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Chul-Min Lee ,  Tae-Kyung Ko ,  Jin-Seong Kim ,  Hyeong-Gon Son ,  Seung-Woo Hong ,  Dong-Gu Lee ,  Sang-Jae Rhee

IPC: G01R31/28 ,  G01R31/317

Abstract: A test method for a semiconductor device includes: loading a test tray having semiconductor devices of first and second lots arranged thereon into a test chamber; storing lot information of each of the semiconductor devices; performing a test program on each of the semiconductor devices; obtaining ID information of each of the semiconductor devices; matching the ID information with the lot information to generate lot sorting information; and sorting the semiconductor devices based on results of the test program and the lot sorting information.