公开(公告)号：US09347772B2

公开(公告)日：2016-05-24

申请号：US14169324

申请日：2014-01-31

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Dae Seo Park ,  Dae Gwan Kim ,  Won Soo Ji ,  Choo Ho Kim

IPC: G01B11/25

CPC classification number: G01B11/2513 ,  G01B11/254

Abstract: An apparatus for measurement of a three-dimensional (3D) shape includes a lens unit transmitting slit beams to a plurality of measurement objects, a light source unit irradiating the plurality of slit beams to the lens unit at different angles, an imaging unit obtaining images of the plurality of measurement objects formed by the slit beams irradiated on the plurality of measurement objects, and a calculation processing unit generating information regarding a 3D shape of the plurality of measurement objects from the images obtained by the imaging unit.

Abstract translation: 一种用于测量三维（3D）形状的装置包括：透镜单元，其向多个测量对象发射狭缝光束;光源单元，以不同的角度将多个狭缝光束照射到所述透镜单元;成像单元，获得图像 所述多个测量对象由照射在所述多个测量对象上的所述狭缝光束形成;以及计算处理单元，从由所述成像单元获得的图像生成关于所述多个测量对象的3D形状的信息。