公开(公告)号：US11966608B2

公开(公告)日：2024-04-23

申请号：US17895318

申请日：2022-08-25

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Dohyeon Park ,  Dongeun Shin ,  Wansoo Choi

IPC: G06F12/00 ,  G06F3/06

CPC classification number: G06F3/064 ,  G06F3/0617 ,  G06F3/0619 ,  G06F3/065 ,  G06F3/0689

Abstract: A memory controller with improved data reliability and a memory system including the same are provided, and an operating method of the memory controller includes, based on deterioration information indicating a location of a deterioration region in the plurality of blocks, with respect to data stored in a first block, copying user data of a RAID to a normal region other than the deterioration region of a second block; copying parity data of the RAID among the data stored in the first block to the deterioration region of the second block; and updating mapping information between data constituting one RAID and transmitting the mapping information to the memory device. The deterioration information includes information regarding one or more word lines at specific locations included in the deterioration region in the plurality of blocks.