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1.
公开(公告)号:US20190311954A1
公开(公告)日:2019-10-10
申请号:US16450383
申请日:2019-06-24
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Ha-Young KIM , Jin Tae KIM , Jae-Woo SEO , Dong-yeon HEO
IPC: H01L21/8234 , H01L27/02 , H01L21/768 , G06F17/50
Abstract: A method of manufacturing a semiconductor device includes configuring a layout pattern; and forming conductive lines corresponding to the layout pattern on a substrate, wherein configuring the layout pattern includes: arranging pre-conductive patterns and post-conductive patterns for a first logic cell, a second logic cell, and a third logic cell; rearranging the pre-conductive patterns and the post-conductive patterns so that two conductive patterns that are adjacent to a boundary between two adjacent logic cells from among the first logic cell, the second logic cell, and the third logic cell are formed by different photolithography processes; and arranging conductive patterns for a dummy cell arranged between the second logic cell and the third logic cell.
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2.
公开(公告)号:US20170287787A1
公开(公告)日:2017-10-05
申请号:US15624039
申请日:2017-06-15
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Ha-Young KIM , JinTae KIM , Jae-Woo SEO , Dong-yeon HEO
IPC: H01L21/8234 , G06F17/50 , H01L21/768 , H01L27/02 , H01L21/8238 , H01L27/06
CPC classification number: H01L21/823475 , G06F17/5072 , G06F17/5081 , H01L21/76816 , H01L21/76892 , H01L21/823871 , H01L27/0207 , H01L27/0629
Abstract: A method of manufacturing a semiconductor device includes configuring a layout pattern; and forming conductive lines corresponding to the layout pattern on a substrate, wherein configuring the layout pattern includes: arranging pre-conductive patterns and post-conductive patterns for a first logic cell, a second logic cell, and a third logic cell; rearranging the pre-conductive patterns and the post-conductive patterns so that two conductive patterns that are adjacent to a boundary between two adjacent logic cells from among the first logic cell, the second logic cell, and the third logic cell are formed by different photolithography processes; and arranging conductive patterns for a dummy cell arranged between the second logic cell and the third logic cell.
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