公开(公告)号：US20230147227A1

公开(公告)日：2023-05-11

申请号：US17814964

申请日：2022-07-26

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Suhun Lim ,  Kijun Lee ,  Myungkyu Lee ,  Eunchul Kwon ,  Hoyoun Kim ,  Jongmin Lee

IPC: G06F11/10 ,  G06F11/07 ,  H03M13/15 ,  G06F17/16

CPC classification number: G06F11/1068 ,  G06F11/0772 ,  G06F11/076 ,  H03M13/1575 ,  G06F17/16

Abstract: A memory controller includes an error correction code (ECC) engine and an error managing circuit. The ECC engine is configured to, during a read operation, perform an ECC decoding on a read codeword set to generate a first and second syndrome associated with a correctable error in a user data set included in the read codeword set, correct the correctable error based on the first syndrome and the second syndrome, and provide the second syndrome to the error managing circuit. The error managing circuit is configured to accumulate second syndromes associated with a plurality of correctable errors and obtained through a plurality of read operations as a plurality of second syndromes, store the plurality of second syndromes, compare the plurality of second syndromes with an error pattern set, and predict an occurrence of an uncorrectable error associated with the correctable error in a memory region based on the comparison.

公开(公告)号：US11815997B2

公开(公告)日：2023-11-14

申请号：US17814964

申请日：2022-07-26

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Suhun Lim ,  Kijun Lee ,  Myungkyu Lee ,  Eunchul Kwon ,  Hoyoun Kim ,  Jongmin Lee

IPC: H03M13/00 ,  G06F11/10 ,  G06F11/07 ,  G06F17/16 ,  H03M13/15

CPC classification number: G06F11/1068 ,  G06F11/076 ,  G06F11/0772 ,  G06F17/16 ,  H03M13/1575

Abstract: A memory controller includes an error correction code (ECC) engine and an error managing circuit. The ECC engine is configured to, during a read operation, perform an ECC decoding on a read codeword set to generate a first and second syndrome associated with a correctable error in a user data set included in the read codeword set, correct the correctable error based on the first syndrome and the second syndrome, and provide the second syndrome to the error managing circuit. The error managing circuit is configured to accumulate second syndromes associated with a plurality of correctable errors and obtained through a plurality of read operations as a plurality of second syndromes, store the plurality of second syndromes, compare the plurality of second syndromes with an error pattern set, and predict an occurrence of an uncorrectable error associated with the correctable error in a memory region based on the comparison.