公开(公告)号：US20220196730A1

公开(公告)日：2022-06-23

申请号：US17480257

申请日：2021-09-21

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hyun-Chul BAEK ,  Yu Jin OH

IPC: G01R31/28

Abstract: A test method for a system on chip, the test method including: receiving a system on chip including a plurality of blocks; booting up the system on chip; storing input values that are input to each of the plurality of blocks, while booting up the system on chip; and performing a test on a first block among the plurality of blocks, wherein performing the test on the first block includes: disabling components of each of the plurality of blocks except the first block, and inputting a first input value to the first block to initialize the first block, wherein the first input value is one of the stored input values that was input to the first block while booting-up the system on chip.