公开(公告)号：US11550685B2

公开(公告)日：2023-01-10

申请号：US16929419

申请日：2020-07-15

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jongseon Shin ,  Kihong Kim

IPC: G06F11/27 ,  G06F21/76 ,  G06F7/58 ,  G06F11/263 ,  G01R31/3183 ,  G01R31/317 ,  G11C29/12 ,  G06F21/74

Abstract: An integrated circuit chip includes a plurality of function blocks; a mode controller configured to convert an input signal, received from an external device through an input/output pin, into an input pattern and test mode setting data which include a plurality of bits, and to output the test mode setting data and a mode switching enable signal when a secure pattern generated therein is the same as the input pattern; and a mode setting module configured to control the plurality of function blocks to operate in a test mode according to the mode setting data, in response to the test mode switching enable signal.