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公开(公告)号：US20190137543A1
公开(公告)日：2019-05-09
申请号：US15995918
申请日：2018-06-01
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Kyoung Hun Eo , Min Gu Kim , In Bong Pok
Abstract: A testing apparatus includes a test head body, a test board coupled to the test head body, and a spring pin block coupled to a lower portion of the test board. The testing apparatus further includes a magnetic field generator penetrating through each of the test head body, the test board, and the spring pin block.
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