公开(公告)号：US20230141749A1

公开(公告)日：2023-05-11

申请号：US17867086

申请日：2022-07-18

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Wenwen HAO ,  YONGWONG KWON ,  Na LIU ,  Yin LUO ,  CHANKYU KOH ,  Lining DOU ,  Lu WANG ,  YOUNG-SEOP SHIM

IPC: G06F11/00 ,  G06N3/08

CPC classification number: G06F11/004 ,  G06N3/08

Abstract: A failure prediction method and device for a storage device are provided. The method comprises: inputting SMART data of the storage device obtained in real time into each of a plurality of base classification models to obtain a classification result for the SMART data of the storage device obtained in real time that is output by the each classification model, wherein the each base classification model is obtained by training using historical SMART data of a plurality of storage devices and/or SMART data of the plurality of storage devices obtained online; determining whether the SMART data of the storage device obtained in real time is healthy data or erroneous data, based on classification results of the plurality of base classification models; predicting whether the storage device will fail, based on a number of SMART data that is determined as healthy data and a number of SMART data that is determined as erroneous data among SMART data of the storage device obtained within a predetermined time window.