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1.
公开(公告)号:US10409683B2
公开(公告)日:2019-09-10
申请号:US15624745
申请日:2017-06-16
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Min-Seok Ko , Hyun-Jung Shin , Jeong-Uk Kang , Ji-Hyung Park
Abstract: A data storage system configured to perform a data rebuild operation via a reduced number of read requests includes a host and a redundant array of independent disks (RAID) device including a plurality of data storage devices. When the host receives data of a first region and data of a second region of a read-requested region of each of the data storage devices in response to a rebuild request, the host receives failed address list information of the second region. The first region is a normal region, and the second region is a faulty region. The host rebuilds the data of the second region based on the failed address list information.
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2.
公开(公告)号:USRE50408E1
公开(公告)日:2025-04-29
申请号:US17470041
申请日:2021-09-09
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Min-Seok Ko , Hyun-Jung Shin , Jeong-Uk Kang , Ji-Hyung Park
Abstract: A data storage system configured to perform a data rebuild operation via a reduced number of read requests includes a host and a redundant array of independent disks (RAID) device including a plurality of data storage devices. When the host receives data of a first region and data of a second region of a read-requested region of each of the data storage devices in response to a rebuild request, the host receives failed address list information of the second region. The first region is a normal region, and the second region is a faulty region. The host rebuilds the data of the second region based on the failed address list information.
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3.
公开(公告)号:US12124368B2
公开(公告)日:2024-10-22
申请号:US17740927
申请日:2022-05-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Byoung-Geun Kim , In-Hwan Doh , Joo-Young Hwang , Seung-Uk Shin , Min-Seok Ko , Jae-Yoon Choi
CPC classification number: G06F12/0253 , G06F9/3816 , G06F12/10 , G06F2212/1044 , G06F2212/657
Abstract: A storage device includes a non-volatile memory including a plurality of memory blocks. The storage device performs an alignment operation in response to receipt of an align command. The alignment operation converts a received logical address of a logical segment into a physical address and allocates the physical address to a physical block address corresponding to a free block. The storage device is further configured to performs a garbage collection in units of the physical block address that indicates one memory block.
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4.
公开(公告)号:US11341043B2
公开(公告)日:2022-05-24
申请号:US16543093
申请日:2019-08-16
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Byoung-Geun Kim , In-Hwan Doh , Joo-Young Hwang , Seung-Uk Shin , Min-Seok Ko , Jae-Yoon Choi
Abstract: A storage device includes a non-volatile memory including a plurality of memory blocks. The storage device performs an alignment operation in response to receipt of an align command. The alignment operation converts a received logical address of a logical segment into a physical address and allocates the physical address to a physical block address corresponding to a free block. The storage device is further configured to performs a garbage collection in units of the physical block address that indicates one memory block.
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公开(公告)号:US20200159656A1
公开(公告)日:2020-05-21
申请号:US16543093
申请日:2019-08-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Byoung-Geun Kim , In-Hwan Doh , Joo-Young Hwang , Seung-Uk Shin , Min-Seok Ko , Jae-Yoon Choi
Abstract: A storage device includes a non-volatile memory including a plurality of memory blocks. The storage device performs an alignment operation in response to receipt of an align command. The alignment operation converts a received logical address of a logical segment into a physical address and allocates the physical address to a physical block address corresponding to a free block. The storage device is further configured to performs a garbage collection in units of the physical block address that indicates one memory block.
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