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公开(公告)号:US20220337260A1
公开(公告)日:2022-10-20
申请号:US17675342
申请日:2022-02-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: HYOCHUL SHIN , SEUNGYEOB BAEK , SUNGNO LEE , HEECHANG HWANG , MICHAEL CHOI
Abstract: An analog-to-digital conversion circuit includes; a first analog-to-digital converter (ADC), a second ADC and a third ADC collectively configured to perform conversion operations according to a time-interleaving technique, and a timing calibration circuit configured to calculate correlation values and determine differences between the correlation values using first samples generated by the first ADC, second samples generated by the second ADC, and third samples generated by the third ADC during sampling periods, wherein the timing calibration circuit is further configured to control a phase of a clock signal applied to the second ADC in response to a change in absolute value related to the differences generated during the sampling periods.
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公开(公告)号:US20220385297A1
公开(公告)日:2022-12-01
申请号:US17827135
申请日:2022-05-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: SUNGNO LEE , HEECHANG HWANG , YONGKI LEE , KYOUNGJUN MOON , HYOCHUL SHIN , MICHAEL CHOI
IPC: H03M1/10
Abstract: An analog-to-digital conversion circuit includes analog-to-digital converters (ADCs) including a target analog-to-digital converter (ADC) providing second data samples, a first adjacent ADC providing first data samples, and a second adjacent ADC providing third data samples. The ADCs perform an analog-to-digital conversion using a time-interleaving approach in response to clock signals having different phases and including a reference clock signal. A timing calibration circuit includes a relative time skew generator generating a relative time skew and an absolute time skew generator generate an absolute time skew. A clock generator adjusts at least one phase of the clock signals based on the absolute time skew.
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