公开(公告)号：US11966288B2

公开(公告)日：2024-04-23

申请号：US17668813

申请日：2022-02-10

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jaehoon Kim ,  Sungjun Kim ,  Kyuseon Son ,  Seunghee Shin ,  Myunggyun Yoon ,  Youngchang Lee

IPC: G06F11/10 ,  G06F11/263 ,  G06F11/27 ,  G06F11/32

CPC classification number: G06F11/1068 ,  G06F11/263 ,  G06F11/27 ,  G06F11/327

Abstract: In an electronic apparatus, a processor executes a program stored in memory to perform essential functions. In the event of an error related to these functions, a self-test application is triggered. The processor may identify a relevant test routine from a set of routines, conduct tests on the function using the identified routine, and communicate the test results to a display. Accordingly, when an error occurs while the electronic apparatus is operating, the electronic apparatus can inform a user and a manufacturer of a cause of the error.