公开(公告)号：US11916565B2

公开(公告)日：2024-02-27

申请号：US17673416

申请日：2022-02-16

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jaerin Lee ,  Minjae Lee ,  Sewon Lee ,  Kyeongkeun Kang

IPC: H03M1/10

CPC classification number: H03M1/1023

Abstract: An analog-to-digital converter is provided. The analog-to-digital converter includes: a sample/hold circuit; a digital-to-analog converter; a plurality of comparison circuits; a control logic; and a digital register, wherein the plurality of comparison circuits include: a first comparison circuit configured to output a first comparison result signal in a first operation period; a second comparison circuit configured to, in a second operation period, calibrate an offset of a second comparison result signal based on a reference signal corresponding to the first comparison result signal among a plurality of reference signals and output the calibrated second comparison result signal; and a third comparison circuit configured to, in a third operation period, calibrate an offset of a third comparison result signal based on a reference signal corresponding to the calibrated second comparison result signal and output the calibrated third comparison result signal.