公开(公告)号：US20210396662A1

公开(公告)日：2021-12-23

申请号：US17348278

申请日：2021-06-15

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Ibrahim A ,  Sreejith Kallummil ,  Sujit Jos ,  Karam Choi ,  Sang Kyu Kim

IPC: G01N21/47 ,  G06N3/04 ,  G01J3/02

Abstract: Provided is a method for predicting optical properties of a sample, the method including obtaining, by a device, a plurality of diffuse reflectance values based on optical energy diffusely reflected from the sample, generating, by a multi-layered Deep Fully Connected Neural Network (DFCNN) in the device, a first set of intermediate values by non-linearly mapping the plurality of diffuse reflectance values to the first set of intermediate values, generating, by a One-Dimensional-Convolutional Neural Network (1D-CNN) in the device, a second set of intermediate values by non-linearly mapping the plurality of diffuse reflectance values to the second set of intermediate values, and predicting, by the device, values of the optical properties of the sample based on the first set of intermediate values and the second set of intermediate values.

公开(公告)号：US11815454B2

公开(公告)日：2023-11-14

申请号：US17187141

申请日：2021-02-26

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sreejith Kallummil ,  Sujit Jos ,  Ibrahim A ,  Ka Ram Choi ,  Sang Kyu Kim

IPC: G01N21/47 ,  G06T7/00 ,  G06N20/00 ,  A61B5/145

CPC classification number: G01N21/4738 ,  A61B5/14532 ,  G06N20/00 ,  G06T7/0012

Abstract: A method of transforming Monte Carlo (MC) simulations for diffuse reflectance spectroscopy (DRS) may include obtaining, by a DRS device, MC simulated DRS measurements using a pre-defined number of photons; pre-processing, by the DRS device, the MC simulated DRS measurements to obtain normalized DRS measurements; correcting, by the DRS device, non-monotonicity of the normalized DRS measurements to obtain monotonic DRS measurements; converting, by the DRS device, the monotonic DRS measurements to a logarithmic domain to obtain logarithmic DRS measurements; performing, by the DRS device, curve fitting on the logarithmic DRS measurements in the logarithmic domain to obtain curve-fitted logarithmic DRS measurements; and transforming, by the DRS device, the curve-fitted logarithmic DRS measurements to a non-logarithmic domain to obtain transformed MC simulated DRS measurements.