Method for detecting defects in semiconductor device

    公开(公告)号:US11507801B2

    公开(公告)日:2022-11-22

    申请号:US16505155

    申请日:2019-07-08

    Abstract: A method for detecting defects in a semiconductor device includes pre-training a pre-trained convolutional neural network (CNN) model using a sampled clean data set extracted from a first data set; training a normal convolutional neural network model and a label-noise convolutional neural network model using first data of the first data set and the pre-trained convolutional neural network model. The method also includes outputting a first prediction result on whether second data of a second data set is good or bad using the second data and the normal convolutional neural network model; and outputting a second prediction result on whether second data is good or bad using the second data and the label-noise convolutional neural network model. The first prediction result is compared with the second prediction result to perform noise correction when there is a label difference. Third data created as results of the noise correction is added to the sampled clean data set. The normal convolutional neural network model and the label-noise convolutional neural network model are additionally using the sampled clean data set with the third data added.

    X-ray imaging apparatus and control method thereof
    2.
    发明授权
    X-ray imaging apparatus and control method thereof 有权
    X射线成像装置及其控制方法

    公开(公告)号:US09538099B2

    公开(公告)日:2017-01-03

    申请号:US14608696

    申请日:2015-01-29

    CPC classification number: H04N5/32 A61B6/4233 A61B6/5205 A61B6/542 H04N5/3454

    Abstract: Disclosed herein is an X-ray imaging apparatus including: a gate driver configured to apply a turn-on signal to a plurality of gate lines; and a readout circuit configured to read out a signal from the plurality of gate lines, wherein if an X-ray signal is detected from a gate line of the plurality of gate lines, the gate driver changes a turn-on time period of the turn-on signal.

    Abstract translation: 本文公开了一种X射线成像装置,包括:门驱动器,被配置为将接通信号施加到多个栅极线; 以及读出电路,被配置为从多个栅极线读出信号,其中如果从多个栅极线的栅极线检测到X射线信号,则栅极驱动器改变转向的接通时间周期 - 信号。

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