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公开(公告)号:US20180033470A1
公开(公告)日:2018-02-01
申请号:US15729771
申请日:2017-10-11
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: KI WON LEE , Seung Jun BAE , Joon Young PARK , Yong Cheol BAE
CPC classification number: G11C7/12 , G11C5/147 , G11C7/1057 , G11C29/021 , G11C29/028 , G11C29/50008 , G11C2207/2254 , H03K19/0005
Abstract: A method of operating a memory controller includes: receiving a data signal from a memory device, wherein the data signal has an output high level voltage (VOH); determining a reference voltage according to the VOH; and comparing the data signal with the reference voltage to determine a received data value, wherein the VOH is proportional to a power supply voltage (VDDQ).
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2.
公开(公告)号:US20170148496A1
公开(公告)日:2017-05-25
申请号:US15426603
申请日:2017-02-07
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Ki Won LEE , Seung Jun BAE , Joon Young PARK , Yong Cheol BAE
CPC classification number: G11C7/12 , G11C5/147 , G11C7/1057 , G11C29/021 , G11C29/028 , G11C29/50008 , G11C2207/2254 , H03K19/0005
Abstract: A semiconductor memory device includes a ZQ calibration unit configured to generate a pull-up VOH code according to a first target VOH proportional to a power supply voltage and an output driver configured to generate a data signal having a VOH proportional to the power supply voltage based on the pull-up VOH code, wherein VOH means “output high level voltage.”
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