-
公开(公告)号:US11410924B2
公开(公告)日:2022-08-09
申请号:US16999388
申请日:2020-08-21
发明人: Haruki Suwa , Keisuke Shigemura , Akihiro Shimada
IPC分类号: H01L21/00 , H01L23/522 , H01L27/11582 , H01L27/11519 , H01L27/1157 , H01L27/11556 , H01L27/11565 , H01L27/11524
摘要: A three-dimensional memory device includes an alternating stack of insulating layers and electrically conductive layers containing steps, memory stack structures extending through the alternating stack, a first contact via structure which contacts a top surface of a respective upper electrically conductive layer in a first step, a first dielectric spacer which does not contact any of the electrically conductive layers other than the respective upper electrically conductive layer in the first step, a second contact via structure which contacts a top surface of a respective lower electrically conductive layer in the first step, and a second dielectric spacer which extends through the respective upper electrically conductive layer, and which contacts the respective lower electrically conductive layer.