公开(公告)号：US20200058372A1

公开(公告)日：2020-02-20

申请号：US16544316

申请日：2019-08-19

Applicant: SEQUENOM, INC.

Inventor： Sung KIM ,  Taylor Jacob JENSEN ,  Mathias EHRICH

IPC: G16B30/00 ,  G16B20/00

Abstract: Provided herein are methods, processes, systems, machines and apparatuses for non-invasive assessment of chromosome alterations.

公开(公告)号：US20240371468A1

公开(公告)日：2024-11-07

申请号：US18436637

申请日：2024-02-08

Applicant: SEQUENOM, INC.

Inventor： Sung KIM ,  Taylor Jacob JENSEN ,  Mathias EHRICH

IPC: G16B20/20 ,  G16B20/00 ,  G16B20/10 ,  G16B30/00 ,  G16B30/10 ,  G16B30/20

Abstract: Provided herein are methods, processes, systems, machines and apparatuses for non-invasive assessment of chromosome alterations.

公开(公告)号：US20160292356A1

公开(公告)日：2016-10-06

申请号：US15026939

申请日：2014-10-03

Applicant: SEQUENOM, INC.

Inventor： Sung KIM ,  Taylor Jacob JENSEN ,  Mathias EHRICH

IPC: G06F19/22

CPC classification number: G16B30/00 ,  G16B20/00

Abstract: Provided herein are methods, processes, systems, machines and apparatuses for non-invasive assessment of chromosome alterations.

Abstract translation: 本文提供了用于非侵入性评估染色体改变的方法，过程，系统，机器和装置。