公开(公告)号：US20210165202A1

公开(公告)日：2021-06-03

申请号：US17106340

申请日：2020-11-30

Applicant: SHIMADZU CORPORATION

Inventor： Hiroshi IWATA ,  Shigehiko ZODA ,  Hiroomi GOTO ,  Eiichi OZEKI ,  Yasuko YONEDA ,  Takahiro NISHIMOTO ,  Naofumi SAKAUCHI ,  Ippei TAKEUCHI

IPC: G02B21/24 ,  H04N5/232 ,  G02B21/36 ,  C12Q1/18

Abstract: One object is to reduce the time required for focusing. When an image capturing condition is not stored (when image capturing of an observation area is performed for the first time), an examination device performs an autofocus process, obtains a focus position where a microscope camera is in focus on the observation area, and stores the obtained focus position in a storage device. In contrast, when the image capturing condition is stored (when image capturing of the observation area is performed for the second and subsequent times), the examination device captures an image of the observation area by reading out the focus position from the storage device and setting a focal point of the microscope camera at the read-out focus position.