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公开(公告)号:US20140015601A1
公开(公告)日:2014-01-16
申请号:US13724143
申请日:2012-12-21
Applicant: SK HYNIX INC.
Inventor: Kyoung Youn LEE
IPC: H02M3/158
Abstract: A power supply circuit to supply an internal voltage to an output node includes: a pull-up driver, in response to a result obtained by comparing the internal voltage to a first reference voltage, configured to generate the internal voltage from a power supply voltage, a pull-down driver, in response to a result obtained by comparing the internal voltage to a second reference voltage, configured to discharge the internal voltage, a pull-up drive blocking unit configured to block the pull-up driver from being driven, in response to the result obtained by comparing the internal voltage to the second reference voltage, and a pull-down drive blocking unit configured to block the pull-down driver from being driven, in response to the result obtained by comparing the internal voltage to the first reference voltage.
Abstract translation: 向输出节点提供内部电压的电源电路包括:上拉驱动器,响应于通过将内部电压与第一参考电压进行比较而获得的结果,被配置为从电源电压产生内部电压, 下拉驱动器,响应于通过将内部电压与第二参考电压进行比较而获得的结果,被配置为对内部电压进行放电,被配置为阻止上拉驱动器被驱动的上拉驱动阻断单元, 响应于通过将内部电压与第二参考电压进行比较获得的结果,以及被配置为阻止下拉驱动器被驱动的下拉驱动阻断单元,响应于通过将内部电压与第一 参考电压。
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公开(公告)号:US20200013450A1
公开(公告)日:2020-01-09
申请号:US16212407
申请日:2018-12-06
Applicant: SK hynix Inc.
Inventor: Seung Min YANG , Kyoung Youn LEE , Byeong Cheol LEE , Don Hyun CHOI
IPC: G11C11/4076 , G11C11/406 , G11C11/408
Abstract: A semiconductor device includes a delay time adjustment circuit and an address input circuit. The delay time adjustment circuit adjusts a point in time when charges are supplied to internal nodes according to a voltage level of a back-bias voltage in response to a test mode signal. The delay time adjustment circuit also delays an active signal by a first delay time varying according to amounts of charge of the internal nodes to generate a bank selection signal. The address input circuit is driven by the back-bias voltage. The address input circuit receives an address in response to the bank selection signal to generate an internal address. The address input circuit delays the address by a second delay time varying according to a voltage level of the back-bias voltage.
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公开(公告)号:US20140049245A1
公开(公告)日:2014-02-20
申请号:US13724355
申请日:2012-12-21
Applicant: SK HYNIX INC.
Inventor: Young Ran KIM , Jae Boum PARK , Kyoung Youn LEE
IPC: G05F1/46
CPC classification number: G05F1/468
Abstract: A reference voltage generation circuit includes: a reference voltage generation unit configured to generate a plurality of reference voltages having mutually different temperature characteristics, a switching unit configured to select and output one of the plurality of reference voltages in response to a control signal, a temperature detection unit configured to detect temperature change and to output a temperature detection signal, and a control unit configured to generate the control signal in response to the temperature detection to signal.
Abstract translation: 参考电压产生电路包括:参考电压生成单元,被配置为产生具有相互不同的温度特性的多个参考电压;开关单元,被配置为响应于控制信号选择并输出多个参考电压中的一个,温度 检测单元,被配置为检测温度变化并输出温度检测信号;以及控制单元,被配置为响应于所述温度检测而产生所述控制信号以进行信号。
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