公开(公告)号：US20220375537A1

公开(公告)日：2022-11-24

申请号：US17395221

申请日：2021-08-05

申请人： SK hynix Inc.

发明人： Min Soo KANG ,  Noh Hyup KWAK ,  Hyun Seung KIM ,  Yong Ho SEO

IPC分类号： G11C29/14 ,  G11C17/16 ,  G11C17/18 ,  G11C29/36

摘要： An electronic device includes a masking signal generation circuit configured to generate a test masking signal by receiving a fuse data during a period in which a test masking mode is executed; and a test mode signal generation circuit configured to, when a test command for executing a test in an internal circuit is input, execute the test based on the test masking signal.